Study of the Contribution of Latent Defects Induced by Swift Heavy Ion Irradiation on the Gate Oxide Breakdown

Authors :: Marinoni, M.
Touboul, Antoine
Zander, D.
Petit, C.
Carvalho, A.M.J.F.
Wrobel, Frédéric
Saigné, Frédéric
Weulersse, C.
Miller, F.
Carriere, T.
Lorfèvre, E.
Institut d’Electronique et des Systèmes (IES)
Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)
Radiations et composants (RADIAC)
Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)
EADS, Corporate Research Center
EADS Paris
Centre National d'Études Spatiales [Toulouse] (CNES)
Source :: 7th European Workshop on Radiation and its Effects on Components and Systems, 7th European Workshop on Radiation and its Effects on Components and Systems, 2008, Jyvaskyla, Finland
Publication Year :: 2008
Publisher :: HAL CCSD, 2008.
Abstract: International audience

Subjects :: ComputingMilieux_MISCELLANEOUS
[SPI.TRON]Engineering Sciences [physics]/Electronics

Language :: English
Database :: OpenAIRE
Journal :: 7th European Workshop on Radiation and its Effects on Components and Systems, 7th European Workshop on Radiation and its Effects on Components and Systems, 2008, Jyvaskyla, Finland
Accession number :: edsair.dedup.wf.001..5089861beb815f56630f3af89aeb338a

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