Search

Your search keyword '"Waldron, Niamh S."' showing total 1 results
Start Over Author "Waldron, Niamh S."
1 results on '"Waldron, Niamh S."'

1. Positive temperature coefficient of impact ionization in strained-Si

Author

Waldron, Niamh S., Pitera, Arthur J., Lee, Minjoo L., Fitzgerald, Eugene A., and del Alamo, Jesus A.

Subjects
Semiconductor wafers -- Electric properties, Semiconductor doping -- Research, Ionization -- Analysis, Business, Electronics, Electronics and electrical industries
Abstract

Impact ionization (II) in the strained Si layer of a strained-Si/SiGe heterostructure is studied. The finding states that the impact ionization multiplication coefficient has a positive temperature coefficient, which is opposite to that of bulk Si.

Published
2005

Catalog

Books, media, physical & digital resources
See catalog results