Search

Microscopy using a scanning approach is reviewed, with numerous references to previous work, as at 1987, before the confocal laser scanning microscope was widely available commercially. The advantages of microscope imaging using a scanning technique are described. The principles of confocal microscopy are introduced. Use of Bessel beam illumination in a confocal microscope is discussed. This combination can increase spatial resolution while retaining some confocal optical sectioning. The advantages of imaging using a scanning method with a point source are detailed. For example, differential phase contrast may be performed to obtain phase information. Use of a point source allows different types of spectroscopy to be performed in a spatially resolved fashion. An advantage of point-source systems for such applications is that imaging, performed with the incident radiation, is separated from wavelength selection and analysis of the emitted radiation, thus simplifying system design and resulting in superior performance. Use of a point source to excite carriers in a semiconducting sample allows the electronic properties of materials and devices to be investigated. Advantages of object scanning, rather than beam scanning, are discussed. Advantages of using a laser source are described, including the use of the heterodyne technique as a synthetic confocal pinhole, and nonlinear microscopy such as two-photon fluorescence and CARS (coherent anti-Stokes Raman spectroscopy). It should be noted that 1987, as well as being before commercial confocal microscopes were widely available, was before the special properties of Bessel beams were appreciated, and before two photon fluorescence microscopy was first experimentally demonstrated.

This Minireview focuses exclusively on work with scanning tunneling microscopy to study the self-assembled multilayer films (SAMTs) of organic molecules. The π-conjugated organic molecules form different structures within different monolayers on various substrates. The interplay between molecule-substrate and intermolecular interactions plays a key role in determining the stacking mode of organic multilayer films. Different substrates strongly influence the organic-film growth and electronic properties of the organic molecules. Geometric and electronic structures of SAMTs are important factors that may determine device performance. In addition to the inorganic interface, this Minireview addresses the organic-organic interface. Homo- and hetero-SAMTs of organic molecules are also considered. The subtle interplay between structural and electronic characteristics, on one hand, and functionality and reactivity, on the other hand, are highlighted.

Detailed structural characterization of novel two-dimensional materials plays a key role in understanding their properties and designing optoelectronic devices. High resolution spatial imaging is important for characterizing defects, edges, and grain boundaries. We use tip-enhanced Raman scattering (TERS) to obtain nanoscale vibrational images of monolayer and few-layer MoS2. We compare near-field and far-field Raman maps and demonstrate high spatial resolution and signal enhancement for various vibrational modes and peak ratios. We observe different spectral behavior and enhancement of edges and inner areas. We show that TERS provides valuable complementary nanoscale information to topographic scanning probe microscopy.

Quality control of nanoparticle production processes requires traceable calibration methods for size and size distribution which are presented and discussed in this article. The main focus is on the one hand the application of small-angle X-ray scattering for an integral measurement of nanoparticles in liquid suspension and on the other hand scanning electron microscopy in transmission for a microscopic measurement method of nanoparticles prepared on a substrate. In addition, characterization by scanning probe microscopy is covered.

This review reports on the combined use of the atomic force microscopy (AFM) and several type of optical/fluorescence/laser scanning microscopy for investigating cells. It is shown that the hybrid systems of AFM with optical-derived microscopies enable to study in detail cell surface properties (such as topography), their mechanical properties (e.g., Young's modulus) mechanotransduction phenomena and allow to gain insight into biological-related pathways and mechanisms in the complex nanoworld of cells. Microsc. Res. Tech. 80:109-123, 2017. © 2016 Wiley Periodicals, Inc.

A tapping mode scanning probe microscopy (TM SPM) system for surface measurement in nanoscale is developed, of which the main element is a scanning probe consisting of quartz tuning fork and a long sharp tungsten tip. Quartz tuning fork is a very good resonant element with piezoelectrical characteristic, and it acts as an actuator and a force sensor simultaneously in the probe. The vertical spatial resolution of the TM SPM is up to sub-nanometer (0.11 nm) and the measuring force is in micro Newton magnitude (about 30 μN). In the scanning operation, the probe vibrates at its resonant frequency, so that the amplitude or frequency (or phase) of the resonant tuning fork is very sensitive to external forces (Its quality factor in air is about 3138). Using the TM SPM constructed by this probe, silicon samples are scanned. Their topography and phase images which indicate the surface material characteristics are reconstructed effectively with a high resolution and low destructiveness. Soft materials, such as Protein structure can also be scanned theoretically without damage. In addition, because of the using of the long sharp tungsten tip, the system has the capacity of measuring micro structures with large aspect ratio, such as large micro steps, deep micro trenches, etc.

A novel optical fiber probe with a parabola-like shape and a nano-antenna mounted on the center of its endface is proposed for simultaneous excitation and collection modes in scanning near-field optical microscopy. The working principles of the probe are demonstrated, and its optical properties are theoretically investigated and compared with the conventional tip-on-aperture probe. It shows that the probe can greatly boost both the enhancement factor for the excitation mode and the collection efficiency for the collection mode. The proposed probe is a promising tool to realize low-cost and high resolution for a wide variety of near-field measurements in biology, physics, and chemistry.

New ZnO nanomaterial was synthesized by laser ablation in liquids. Zinc oxide nanoparticles supported on natural polymer – natural cotton. Antibacterial properties of the composites were investigated. Surface of the material and the distribution of nanoparticles on it were studied using scanning electron microscopy, and confocal scanning microscopy. The possibility of confocal scanning microscopy to distinguish between fluorescent labels such as ZnO.

The simultaneous acquisition of morphological and chemical information from solid surfaces with a nanoscale lateral resolution is being increasingly considered in modern materials and biological research. Due to their respective advantages, combining scanning probe microscopy (SPM) and mass spectrometry (MS) with field evaporation, thermal desorption, and near-field enhancement is a perfect approach that satisfies the above-outlined research requirements. This review covers the analytical trends of these combined techniques. Relevant research from recent years will be summarized, the principles of the representative techniques highlighted, applications briefly introduced, and potential problems discussed.

In this article we investigate the possibility to use scanning capacitance microscopy (SCM) for the 2-D and 3-D "atomistic" dopant profiling of semiconductor materials. For this purpose, we first analyze the effects of random dopant fluctuations (RDF) on SCM measurements with nanoscale probes and show that the discrete and random locations of dopant impurities significantly affect the differential capacitance measured in SCM experiments if the dimension of the probe is below 50 nm. Then, we present an algorithm to compute the x, y, and z coordinates of the ionized impurities in the semiconductor material using a set of SCM measurements. The algorithm is based on evaluating the doping sensitivity functions of the differential capacitance and uses a gradient-based iterative method to compute the locations of dopants. Finally, we discuss a standard simulation case and show that we are able to successfully retrieve the locations of the ionized impurities using the proposed algorithm.

In this study, we present a scanning thermal microscopy experiment with the probe working under vacuum allowing a spatial resolution of 25 nm. These measurements are made with a new four-contacts resistive probe, well suited for the 3ω measurement technique. A system identification approach in the out-of-contact mode provides the thermal model of the probe. This approach does not require knowledge of the geometrical and thermal properties of the probe. This sensor model is integrated into a comprehensive global model taking into account the heat transfer within the investigated surface. We show that the contact resistance and the radius of the contact area at the probe–material interface can be identified and are independent of the nature of the probed material when thermal conductivity ranges from 0.2 to 41 $\mathrm{W\cdot m^{-1}\cdot K^{-1}}$ .

Due to its importance, heterogeneous catalysis has been studied extensively over the last 100 years. Much of our current knowledge, however, has been obtained under conditions that deviate significantly from practical catalysis. This stems from the fact that most techniques, suitable for obtaining meaningful results at the atomic scale, cannot be used under industrial conditions of high pressures and temperatures. Therefore, the investigation of catalysis under more realistic conditions, but without compromising the atomic scale, inescapably forms the next step. When catalytic processes at the atomic scale under real conditions are understood, new and better catalysts can be developed from rational design rather than from trial and error. This article focuses on the development of scanning probe microscopy, surface X-ray diffraction, and optical microscopy for operando observations of active model catalysts. We combine the structural observations obtained under high-pressure, high-temperature conditions with the time-resolved mass spectrometry measurements on the gas mixture leaving the reactor. In this way we can correlate structural changes of the catalyst surface due to the presence of reactive gases with the catalytic performance.

High temperature scanning probe microscopy at in operando conditions at temperatures up to 850°C in reducing and oxidizing atmospheres is a relatively new technique. The unique controlled atmosphere high temperature scanning probe microscopes are used for studying electrical and electrochemical properties of metal and metal oxide surfaces on a submicron scale. Localized probing techniques such as AC conductance mapping, local impedance spectroscopy and Kelvin probe force microscopy are used for elucidating solid oxide cell degradation mechanisms and surface reactions. The ability to combine electrical information with chemical and microstructural information from other techniques on a submicron scale gives a more complete and detailed picture of the surface properties.

Tip-enhanced Raman spectroscopy (TERS) is a powerful scanning probe technique for Raman detections in nanotechnology to date. However, limited by the physical principles of a nanosize tapered metal (or metal-coated) probe used in a TERS device, only far-field without near-field Raman signal can be collected by the TERS with the metal probe. This makes conventional TERS lower in efficiency and cannot be a real near-field Raman microscopy. In this paper, we propose a simple and realizable optoplasmonic probe model, which is composed of a dielectric microsphere and a metal nanobowtie, to realize an ideal scanning near-field Raman microscopy (SNRM). Using finite-difference time-domain (FDTD) method, calculation results of electric field distributions of the proposed probe demonstrate that the probe provides three outstanding characteristics, including strong enhancement of local electric field, nanoscale distributions of the produced electric filed, and collection enhancement of emitted energy with wide wavelength range in near field. These characteristics of the probe resolve the detecting restrictions of metal probes and provide a real near-field scanning method. Therefore, a potentially novel SNRM can be expected to extend Raman application range greatly.

Atomic force microscopy is employed to study the structural changes in the morphology and physical characteristics of asphaltene aggregates as a function of temperature. The exotic fractal structure obtained by evaporation-driven asphaltene aggregates shows an interesting dynamics for a large range of temperatures from 25°C to 80°C. The changes in the topography, surface potential and adhesion are unnoticeable until 70°C. However, a significant change in the dynamics and material properties is displayed in the range of 70°C - 80°C, during which the aspahltene aggregates acquire ‘liquid-like’ mobility and fuse together. This behaviour is attributed to the transition from the pure amorphous phase to a crystalline liquid phase which occurs at approximately 70°C as shown by using Differential Scanning Calorimetry (DSC). Additionally, the charged nature of asphaltenes and bitumen is also explored using kelvin probe microscopy. Such observations can lead to the development of a rational approach to the fundamental understanding of asphaltene aggregation dynamics and may help in devising novel techniques for the handling and separation of asphaltene aggregates using dielectrophoretic methods.

Label-free optical microscopy plays an important role in biological research. Coherent Raman microscopy combines three-dimensional resolution and fast image acquisition with molecular selectivity based on the vibrational spectrum of the sample. During the last years stimulated Raman scattering (SRS) microscopy has become an important technique in this framework since it does not display an electronic nonresonant background signal and enhances quantitative data analysis. In this method, the energy difference of two quasi-monochromatic beams is tuned to be resonant with a vibrational resonance leading to an energy transfer from the pump to the Stokes field in presence of SRS. To optimize the image acquisition time, we employed Nyquist frequency modulation with boxcar averaging of the signal.

Traditional electrochemical characterization microscopy methods based on charge measurement do not provide nanometer spatial resolution. The recently developed electrochemical scanning microscopy (ESM) which is based on atomic force microscopy (AFM) provides nanoscale measurements, however, the electrochemical measurements consist of other effects such as electromechanical and electrostatic effects. We developed a scanning thermo-ionic microscopy (STIM) to probe local electrochemical activities at the nanoscale regime. The microscopy mechanism is based on imaging the Vegard strain induced by thermally driven stress and temperature oscillation. The Vegard strain linearly correlates with material lattice constant and can be used as a measure of ionic species concentration. Through theoretical analysis and experimental validation, we have demonstrated that second and fourth harmonic components of the AFM deflection signal contains information about species concentration. It is demonstrated that the second harmonic response predominantly correlates with the local thermal expansion information, while the fourth harmonic one is characteristic of local transport activities that is presented only in ionic systems. All our measurements are resonance enhanced and since the tip-sample resonance varies during scanning, four lock-in units and a PID controller are integrated with the AFM to track the resonance frequency. The technique has been applied to probe Sm-doped nanocrystalline Ceria and LiFePO4, both of which exhibit higher STIM amplitude near grain boundaries as expected. The STIM is an innovative tool to study local electrochemistry with high sensitivity and spatial resolution for a wide range of systems, without any electrical cross-talk which makes it suitable to be applied in operando.

This chapter is dedicated to scanning probe microscopy (SPM ) operated at cryogenic temperatures, where the more fundamental aspects of phenomena important in the fields of nanoscience and nanotechnology can be investigated with high sensitivity under well-defined conditions. In general, scanning probe techniques allow the measurement of physical properties down to the nanometer scale. Some techniques, such as scanning tunneling microscopy (STM ) and scanning force microscopy (SFM ), even go down to the atomic scale. Various properties are accessible. Most importantly, one can image the arrangement of atoms on conducting surfaces by STM and on insulating samples by SFM. However, electronic states (scanning tunneling spectroscopy), force interaction between different atoms (scanning force spectroscopy), magnetic domains (magnetic force microscopy), magnetic exchange interactions (magnetic exchange force microscopy and spectroscopy), local capacitance (scanning capacitance microscopy), local contact potential differences (Kelvin probe force microscopy), local temperature (scanning thermal microscopy), and local light-induced excitations (scanning near-field microscopy) can also be measured with high spatial resolution, among others. In addition, some modern techniques even allow the controlled manipulation of individual atoms/molecules and the visualization of the internal structure of individual molecules. Moreover, combined STM/SFM experiments are now possible, mainly thanks to the advent of tuning forks as sensing elements in low-temperature (LT) SPM systems. Probably the most important advantage associated with the low-temperature operation of scanning probes is that it leads to a significantly better signal-to-noise ratio than measuring at room temperature. This is why many researchers work below 100 K. However, there are also physical reasons to use low-temperature equipment. For example, visualizing the internal structure of molecules with SFM or the utilization of scanning tunneling spectroscopy with high energy resolution can only be realized at low temperatures. Moreover, some physical effects such as superconductivity or the Kondo effect are restricted to low temperatures. Here, we describe the advantages of low-temperature scanning probe operation and the basics of related instrumentation. Additionally, some of the important results achieved by low-temperature scanning probe microscopy are summarized. We first focus on the STM, giving examples of atomic manipulation and the analysis of electronic properties in different material arrangements, among others. Afterwards, we describe results obtained by SFM, reporting on atomic-scale and submolecular imaging, as well as three-dimensional (3-D ) force spectroscopy. Results obtained with the method of Kelvin probe force microscopy (KPFM ) that is used to study variations in local contact potential difference (LCPD ) are briefly discussed. Magnetic force microscopy (MFM ), magnetic exchange force microscopy (MExFM ), and magnetic resonance force microscopy (MRFM ) are also introduced. Although the presented selection of results is far from complete, we feel that it gives an adequate impression of the fascinating possibilities of low-temperature scanning probe instruments. In this chapter low temperatures are defined as lower than about 100 K and are normally achieved by cooling with liquid nitrogen or liquid helium. Applications in which SPMs are operated close to 0∘C are not covered in this chapter.

The use of low energy electrons in the analysis of materials at the nanoscale will play a significant role over many research areas including biological, medical, data storage, computing and renewable energy. This recent trend in these fields is to employ low energy primary electrons for better resolution and specificity of the resulting analysis. Here, we will discuss the method we have implemented that combines the essential functionalities of two types of microscopies; thereby, creating a quite compact instrument that can readily be integrated into ultrahigh vacuum scanning probe microscopy systems. The close proximity between the source and the specimen provides a means of overcoming the limitations of conventional scanning electron microscopes and opens the possibility to use lower primary beam energies ( 50 eV). We have named this technique, “near field emission scanning electron microscopy,” and this chapter will summarize the developmental phases of the device.

The widespread use of scanning probe microscopy (SPM) techniques has revolutionized many scientific and industrial fields, especially material science, by allowing the surface morphology to be visualized and the composition or properties of materials to be probed at the atomic or submolecular scale. Here, we review the recent innovations in SPM techniques applied to modern material science, from two-dimensional covalent supramolecular systems based on bottom-up nanotechnology to advanced material development for polymer electrolyte fuel cells and thin film solar. Among the variety of SPM methods, electrochemical scanning tunneling microscopy, atomic force microscopy, conductive atomic force microscopy, and Kelvin probe force microscopy are discussed.

An important technique for high resolution optical imaging, beyond the diffraction limit, of nanostructured surfaces is aperture near-field scanning optical microscopy (NSOM). Even though NSOM has already demonstrated its good performance in a number of different applications, its quantitative application is still a challenge, due to a number of factors, which commonly influence the quality of the measurement output and consequently extrapolation of quantitative parameters. In this paper, a systematic study is reported, analyzing the effect of the most critical factors in cantilever NSOM measurements, with particular attention to tip geometry and aperture, scanning configuration, and scan mode. Investigations have been carried out on a commercial instrument, in combination with reference standard for NSOM calibration (as for instance the Fisher pattern) and other samples opportunely produced for this paper.

We present the design, batch fabrication sequences and mechanical characterization of an optical near-field probe. The probe structure is made of a hybrid organo-mineral material synthesized using a sol–gel process. The cantilever-type probe was designed for Scanning Near-field Optical Microscopy (SNOM) in collection mode and its design was optimized by simulations. The mechanical properties of the probes were measured and topographical images of a standard surface obtained with the fabricated probes are presented.

Typical measurements of light in the near-field utilize a photodetector such as a photomultiplier tube or a photodiode, which is placed remotely from the region under test. This kind of detection has many draw-backs including the necessity to detect light in the far-field, the influence of background propagating radiation, the relatively narrowband operation of photodetectors which complicates the operation over a wide wavelength range, and the difficulty in detecting radiation in the far-IR and THz. Here we review an alternative near-field light measurement technique based on the detection of optically induced forces acting on the scanning probe. This type of detection overcomes some of the above limitations, permitting true broad-band detection of light directly in the near-field with a single detector. The physical origins and the main characteristics of optical force detection are reviewed. In addition, intrinsic effects of the inherent optical forces for certain operation modalities of scanning probe microscopy are discussed. Finally, we review practical applications of optical force detection of interest for the broader field of the scanning probe microscopy.

Scanning transmission electron microscopy in scanning electron microscopy (STEM-in-SEM) is a convenient technique for soft materials characterization. Various specimen-holder geometries and detector arrangements have been used for bright-field (BF) STEM-in-SEM imaging. In this study, to further the characterization potential of STEM-IN-SEM, a new specimen holder has been developed to facilitate direct detection of BF signals and indirect detection of dark-field (DF) signals without the need for substantial instrument modification. DF imaging is conducted with the use of a gold (Au)-coated copper (Cu) plate attached to the specimen holder which directs highly scattered transmitted electrons to an off-axis yttrium-aluminum-garnet (YAG) detector. A hole in the copper plate allows for BF imaging with a transmission electron (TE) detector. The inclusion of an Au-coated Cu plate enhanced DF signal intensity. Experiments validating the acquisition of true DF signals revealed that atomic number (Z) contrast may be achieved for materials with large lattice spacing. However, materials with small lattice spacing still exhibit diffraction contrast effects in this approach. The calculated theoretical fine probe size is 1.8 nm. At 30 kV, in this indirect approach, DF spatial resolution is limited to 3.2 nm as confirmed experimentally.

Ultrafast infrared spectroscopy can reveal the dynamics of vibrational excitations in matter. In its conventional far-field implementation, however, it provides only limited insight into nanoscale sample volumes due to insufficient spatial resolution and sensitivity. Here, we combine scattering-scanning near-field optical microscopy (s-SNOM) with femtosecond infrared vibrational spectroscopy to characterize the coherent vibrational dynamics of a nanoscopic ensemble of C-F vibrational oscillators of polytetrafluoroethylene (PTFE). The near-field mode transfer between the induced vibrational molecular coherence and the metallic scanning probe tip gives rise to a tip-mediated radiative IR emission of the vibrational free-induction decay (FID). By increasing the tip–sample coupling, we can enhance the vibrational dephasing of the induced coherent vibrational polarization and associated IR emission, with dephasing times up to T2(NF) is approximately equal to 370 fs in competition against the intrinsic far-field lifetime of T2(FF) is approximately equal to 680 fs as dominated by nonradiative damping. Near-field antenna-coupling thus provides for a new way to modify vibrational decoherence. This approach of ultrafast s-SNOM enables the investigation of spatiotemporal dynamics and correlations with nanometer spatial and femtosecond temporal resolution.

A novel method of sample cross sectioning, beam-exit Ar-ion cross-sectional polishing, has been combined with scanning probe microscopy to study thin AlxGa1-xAs/GaAs layers. Additional contrast enhancement via a citric acid/hydrogen peroxide etch allows us to report the observation of layers as thin as 1 nm. Layer thickness measurements agree with transmission electron microscopy (TEM) data to 0.1 ± 0.2 nm, making this a very promising low-cost method for nanoscale analysis of semiconductor heterostructures.

The distribution of the local current in GdBCO coated conductors was investigated using low-temperature scanning laser and Hall probe microscopy (LTSLHPM). We prepared GdBCO coated conductors to study the spatial distribution of the current density in a single bridge. Inhomogeneity in the bridge was analyzed using the experimental results of scanning laser microscopy near the superconducting transition. The local transport and screening currents in the bridge were also obtained by scanning Hall probe microscopy. From the experimental results of scanning laser and Hall probe microscopy, we have observed redistribution of the current caused by defects of the coated conductors.

In this work, we imaged exosomes with scanning tunneling microscopy (STM) and broadband scanning microwave microscopy (SMM) simultaneously, using exosomes prepared by a new salivary isolation method. By transforming the frequency-domain data to the time domain with optimum time gating, exosome images of higher contrast and resolution were obtained by using SMM than by using STM or atomic force microscopy (AFM).

We report on an analytical method for investigating the signal contrast obtained in near-field scanning millimeter-wave microscopy using a metal slit probe. The probe has a slit-like aperture at the open end of a rectangular metal waveguide. In our method, the electromagnetic field around the slit aperture at the probe tip is calculated from Maxwell's equations in the Fourier (wavenumber) domain in order to derive the electrical admittance of a sample system consisting of layered dielectrics as seen from the probe tip. An equivalent two-port electrical circuit of the probe waveguide terminated by this admittance is then used to calculate the complex reflection coefficient of the probe as a signal. The validity of the method is verified by experiments.

International audience; We report the design of a new type of scanning near-field optical microscopy probes combining the advantages of both tapered optical fibres type and cantilever type commercial scanning near-field optical microscopy probes. The material is an organomineral synthesized by the sol-gel method. This material matches mechanical and optical performances for such a scanning near-field optical microscopy probe fabrication. Numerical calculations were carried out using finite element method in order to study the optical transmission of the probe in emission and collection modes. The influence of the probe geometry on the intensity distribution in the vicinity of the aperture and in the extremity of the cantilever is studied in details.

In this paper, we reported a rotary scanning optical resolution photoacoustic microscopy that is free of raster scanning. Both carbon fibers and mice ears were imaged to evaluate the performance of the system.

In this paper, the features of the microstructure of magnetic domains observed in ferrite-garnet films (FGF) have been presented. The studied FGF with orientation (111) were grown on gallium-gadolinium substrate by using liquid-phase epitaxy. The study of distribution inherent to magnetic domains was carried out using magnetic force microscopy (MFM) with the scanning probe microscope NanoScope IIIa Dimension 3000TM. In the course of these researches, optimization of the MFM method was carried out to obtain high-quality and correct images of magnetic domains in FGF. Nanorelief and magnetic microstructure of FGF surface were studied, depending on their thickness, on external magnetic field and doses of boron ion implantation. For these objects, it was established that stripe domain structure is characteristic, the period of which depends on the film thickness. The nature of transformation of domain structure depending on thickness is close to that theoretically predictable at low thicknesses (up to 10 µm). Nanorelief of film surfaces is virtually unchanged depending on thickness. An external magnetic field with the magnitude 4 mT causes significant changes in domain configuration and allows to visualize heterogeneity of magnetic structure. Ion implantation leads to a slight smoothing of nanorelief films (roughness of 0.2 nm) and to more accurate displaying the magnetic microstructure, which is associated with processes of structural ordering under ionic bombardment.

To characterize magnetic materials on nanoscales, a new technique has been developed which is based on the combination of two scanning thermal near-field techniques: the thermally modulated ferromagnetic resonance induced by the probe of a scanning thermal wave microscope and the detection of the 3ω signal from the same thermal probe. The simultaneous detection of the thermally modulated microwave absorption and of the 3ω response of the nanoprobe offers a means to control the thermal contact between probe and sample during scans across the sample. In this contribution, the experimental setup is described and results of measurements conducted on Fe-based structures deposited on a MgO substrate are presented.