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Optically induced forces in scanning probe microscopy
- Source :
- Nanophotonics, Vol 3, Iss 1-2, Pp 105-116 (2014)
- Publication Year :
- 2014
- Publisher :
- De Gruyter, 2014.
-
Abstract
- Typical measurements of light in the near-field utilize a photodetector such as a photomultiplier tube or a photodiode, which is placed remotely from the region under test. This kind of detection has many draw-backs including the necessity to detect light in the far-field, the influence of background propagating radiation, the relatively narrowband operation of photodetectors which complicates the operation over a wide wavelength range, and the difficulty in detecting radiation in the far-IR and THz. Here we review an alternative near-field light measurement technique based on the detection of optically induced forces acting on the scanning probe. This type of detection overcomes some of the above limitations, permitting true broad-band detection of light directly in the near-field with a single detector. The physical origins and the main characteristics of optical force detection are reviewed. In addition, intrinsic effects of the inherent optical forces for certain operation modalities of scanning probe microscopy are discussed. Finally, we review practical applications of optical force detection of interest for the broader field of the scanning probe microscopy.
- Subjects :
- Materials science
scanning near-field optical microscopy (snom)
QC1-999
atomic force microscopy (afm)
Scanning gate microscopy
Scanning capacitance microscopy
optical forces
Scanning probe microscopy
near-field scanning optical microscopy (nsom)
near-field optics
Microscopy
scanning probe microscopy (spm)
Electrical and Electronic Engineering
opto-mechanical resonator
opto-mechanics
business.industry
Physics
Scanning confocal electron microscopy
Atomic and Molecular Physics, and Optics
Electronic, Optical and Magnetic Materials
kelvin probe force microscopy (kpfm)
Scanning ion-conductance microscopy
Optoelectronics
Near-field scanning optical microscope
business
Vibrational analysis with scanning probe microscopy
Biotechnology
Subjects
Details
- Language :
- English
- ISSN :
- 21928614 and 21928606
- Volume :
- 3
- Issue :
- 1
- Database :
- OpenAIRE
- Journal :
- Nanophotonics
- Accession number :
- edsair.doi.dedup.....2f2527046830eacecbda0a8f111469f2