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Results of studies of the effect of the buffer layer 1.3PbO 0.5ZrO2 0.5TiO2 (conditional composition is Pb1.3(Zr0.5Ti0.5)O3) on the properties of Pb(Zr0.5Ti0.5)O3 films on Ti and Pt substrates are considered. The films are obtained by metal organic deposition method (MOD). Films deposited on Pt substrate (with the buffer layer or without it) do not show fatigue up to N = 109 (where N is number of switching cycles) on Pr(N) and Ec(N) dependences. For films deposited on Ti substrates with the intermediate buffer layer Pr(N) dependences demonstrate a basically new feature: after ∼108 switching cycles the remanent polarization increases. The increase of Pr is 50% at N = 1010, the increase of coercive field is small. [ABSTRACT FROM AUTHOR]

(Pb0.9Ba0.05Sr0.05)(Zr1-xTix)O3 solid solutions series in which the width of the morphotropic region (MR) (determined by X-ray structure analysis) does not exceed 0.5%, are obtained using a modified ceramic technique. The grain size of the ceramics is 20-25 µm. As established by the performed investigations, piezoelectric and dielectric properties of ceramic samples and diffusion of PE phase transition depends on the position of the given solid solution in the phase diagram. The maximum diffusion is observed in the middle of MR. There exists a temperature range ΔTcf of the order of several decades of degrees above the Curie point, where piezoelectric resonance can be observed. ΔTcf value reduces considerably when moving from MR. [ABSTRACT FROM AUTHOR]