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1. Characterization of buried interfaces using Ga Kα hard X-ray photoelectron spectroscopy (HAXPES)

2. Dual beam organic depth profiling using large argon cluster ion beams

3. Electronic structure of potassium-doped La@ C82 metallofullerene studied with photoelectron spectroscopy

4. British society for matrix biology autumn meeting

5. Electrostatic ordering of the lanthanum endoatom in La@C 82 adsorbed on metal surfaces

6. Site occupancy of chlorine on Cu(111) using normal-incidence x-ray standing waves: The energy difference between fcc and hcp hollow sites

7. Modulations of valence-band photoemission spectrum from (formula presented) monolayers on Ag(111)

8. XPS and AFM surface studies of solvent-cast PS/PMMA blends

10. Surface feature size of spin cast PS/PMMA blends

11. Quantitative and Qualitative Analyses of Mass Spectra of OEL Materials by Artificial Neural Network and Interface Evaluation: Results from a VAMAS Interlaboratory Study.

12. Cryo-XPS for Surface Characterization of Nanomedicines.

13. Surface Analysis of Pristine and Cycled NMC/Graphite Lithium-Ion Battery Electrodes: Addressing the Measurement Challenges.

14. Deagglomeration of DNA nanomedicine carriers using controlled ultrasonication.

15. In situ methods: discoveries and challenges: general discussion.

16. Composition, thickness, and homogeneity of the coating of core-shell nanoparticles-possibilities, limits, and challenges of X-ray photoelectron spectroscopy.

17. Versailles project on advanced materials and standards (VAMAS) interlaboratory study on measuring the number concentration of colloidal gold nanoparticles.

18. Molecular Formula Prediction for Chemical Filtering of 3D OrbiSIMS Datasets.

19. Method for Molecular Layer Deposition Using Gas Cluster Ion Beam Sputtering with Example Application In Situ Matrix-Enhanced Secondary Ion Mass Spectrometry.

20. Measurement of Peptide Coating Thickness and Chemical Composition Using XPS.

21. Thickness measurement of nm HfO 2 films.

22. Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene.

23. Protein identification by 3D OrbiSIMS to facilitate in situ imaging and depth profiling.

25. Sticky Measurement Problem: Number Concentration of Agglomerated Nanoparticles.

26. Number Concentration of Gold Nanoparticles in Suspension: SAXS and spICPMS as Traceable Methods Compared to Laboratory Methods.

27. Practical Guides for X-Ray Photoelectron Spectroscopy (XPS): First Steps in planning, conducting and reporting XPS measurements.

28. Robust and accurate measurements of gold nanoparticle concentrations using UV-visible spectrophotometry.

29. Exposure of mass-selected bimetallic Pt-Ti nanoalloys to oxygen explored using scanning transmission electron microscopy and density functional theory.

30. Comparisons of Analytical Approaches for Determining Shell Thicknesses of Core-Shell Nanoparticles by X-ray Photoelectron Spectroscopy.

31. Peptide engineered microcantilevers for selective chemical force microscopy and monitoring of nanoparticle capture.

33. Chemical measurements of polyethylene glycol shells on gold nanoparticles in the presence of aggregation.

34. Multitechnique characterization of oligo(ethylene glycol) functionalized gold nanoparticles.

35. Versailles Project on Advanced Materials and Standards Interlaboratory Study on Measuring the Thickness and Chemistry of Nanoparticle Coatings Using XPS and LEIS.

36. Evaluation of Two Methods for Determining Shell Thicknesses of Core-Shell Nanoparticles by X-ray Photoelectron Spectroscopy.

37. A Technique for Calculation of Shell Thicknesses for Core-Shell-Shell Nanoparticles from XPS Data.

38. Size and ζ-Potential Measurement of Silica Nanoparticles in Serum Using Tunable Resistive Pulse Sensing.

39. Correction to Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study.

40. Sputtering Yields for Mixtures of Organic Materials Using Argon Gas Cluster Ions.

41. Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size.

42. Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study.

43. Evaluating the Internal Structure of Core-Shell Nanoparticles Using X-ray Photoelectron Intensities and Simulated Spectra.

45. Quantifying ligand-cell interactions and determination of the surface concentrations of ligands on hydrogel films: The measurement challenge.

46. Analysis of protein coatings on gold nanoparticles by XPS and liquid-based particle sizing techniques.

47. Angle dependence of argon gas cluster sputtering yields for organic materials.

48. Neutralized chimeric avidin binding at a reference biosensor surface.

49. 3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling.

50. Effects of temperature and ammonia flow rate on the chemical vapour deposition growth of nitrogen-doped graphene.

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