484 results on '"Salvo, B."'
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2. Multiple Binary OxRAMs as Synapses for Convolutional Neural Networks
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3. Contributors
4. Emerging memory technologies for neuromorphic hardware
5. Resistive Memories for Spike-Based Neuromorphic Circuits
6. Impact of Sb doping on power consumption and retention reliability of GeS2 based conductive bridge random access memory
7. A technological and electrical study of self-aligned charge-trap split-gate memory devices
8. Material engineering of GexTe100−x compounds to improve phase-change memory performances
9. Redox behavior of a ferrocene monolayer on SiO2 obtained after click-coupling
10. On the impact of Ag doping on performance and reliability of GeS2-based conductive bridge memories
11. Role of Ti and Pt electrodes on resistance switching variability of HfO2-based Resistive Random Access Memory
12. High temperature reliability of μtrench Phase-Change Memory devices
13. Carbon-doped GeTe: A promising material for Phase-Change Memories
14. Accurate analysis of parasitic current overshoot during forming operation in RRAMs
15. Defects-induced gap states in hydrogenated γ-alumina used as blocking layer for non-volatile memories
16. Analysis by simulation of amorphization current in phase change memory applied to pillar and GST confined type cells
17. Investigation of charge-trap memories with AlN based band engineered storage layers
18. Comparative study of non-polar switching behaviors of NiO- and HfO 2-based oxide resistive-RAMs
19. Reliability of charge trapping memories with high- k control dielectrics (Invited Paper)
20. Impact of a HTO/Al 2O 3 bi-layer blocking oxide in nitride-trap non-volatile memories
21. Integration of CVD silicon nanocrystals in a 32 Mb NOR flash memory
22. Evaluation of HfAlO high- k materials for control dielectric applications in non-volatile memories
23. Contributor contact details
24. Improving embedded Flash memory technology: silicon and metal nanocrystals, engineered charge-trapping layers and split-gate memory architectures
25. Improved size dispersion of silicon nanocrystals grown in a batch LPCVD reactor
26. Charge transport in thin interpoly nitride/oxide stacked films
27. Reduction of fixed charges in atomic layer deposited Al2O3 dielectrics
28. Investigation of SiO 2/HfO 2 gate stacks for application to non-volatile memory devices
29. 15 - Emerging memory technologies for neuromorphic hardware
30. Multi-bit storage through Si nanocrystals embedded in SiO 2
31. Silicon nanocrystal memories
32. CVD Growth and Passivation of W and TiN Nanocrystals for Non-Volatile Memory Applications
33. Influence of dots size and dots number fluctuations on the electrical characteristics of multi-nanocrystal memory devices
34. Single electron charging and discharging phenomena at room temperature in a silicon nanocrystal memory
35. Electrical characterization of fast transient phenomena in a Si-rich based non-volatile random access memory
36. (Invited) Future Challenges and Diversifications for Nanoelectronics by the End of the Roadmap and Beyond
37. Effects of partial self-ordering of Si dots formed by chemical vapor deposition on the threshold voltage window distribution of Si nanocrystal memories
38. Electrical characterization and modeling of MOS structures with an ultra-thin oxide
39. Transport mechanisms and charge trapping in thin dielectric/Si nano-crystals structures
40. Investigation of charging/discharging phenomena in nano-crystal memories
41. A general bulk-limited transport analysis of a 10 nm-thick oxide stress-induced leakage current
42. Study of stress induced leakage current by using high resolution measurements
43. On the correlation between SILC and hole fluence throughout the oxide
44. ONO and NO interpoly dielectric conduction mechanisms
45. Investigation of low field and high temperature SiO 2 and ONO leakage currents using the floating gate technique
46. Heavy-ion upset immunity of RRAM cells based on thin HfO2 layers
47. Guidance to reliability improvement in CBRAM using advanced KMC modelling
48. Charge transport in thin interpoly nitride/oxide stacked films.
49. 4 - Improving embedded Flash memory technology: silicon and metal nanocrystals, engineered charge-trapping layers and split-gate memory architectures
50. Investigation of HfO2/Ti based vertical RRAM - Performances and variability
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