26 results on '"Robert Madge"'
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2. In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost.
3. Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model.
4. ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test.
5. Detection of Temperature Sensitive Defects Using ZTC.
6. Impact of Multiple-Detect Test Patterns on Product Quality.
7. Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ.
8. Creating Value Through Test.
9. Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs.
10. Screening MinVDD Outliers Using Feed-Forward Voltage Testing.
11. Isolating and Removing Sources of Variation in Test Data.
12. Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies.
13. Neighbor selection for variance reduction in I_DDQ and other parametric data.
14. New test paradigms for yield and manufacturability.
15. Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs.
16. Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort.
17. Making Manufacturing Work For You.
18. Variance reduction and outliers: statistical analysis of semiconductor test data.
19. Data-driven models for statistical testing: measurements, estimates and residuals.
20. Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis.
21. The value of statistical testing for quality, yield and test cost improvement.
22. New Test Paradigms for Yield and Manufacturability.
23. ATE Value Add through Open Data Collection.
24. Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data.
25. Design-enabled manufacturing enablement using manufacturing design request tracker (MDRT)
26. Position statement
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