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Design-enabled manufacturing enablement using manufacturing design request tracker (MDRT)

Authors :
Luigi Capodieci
Vito Dai
Sarah McGowan
Rao Desineni
Kok Peng Chua
Sky Yeo
Carl P. Babcock
Akif Sultan
Eswar Ramanathan
Colin Hui
Robert Madge
Kristina Hoeppner
Jens Hassmann
Edward Kah Ching Teoh
Source :
ASMC 2013 SEMI Advanced Semiconductor Manufacturing Conference.
Publication Year :
2013
Publisher :
IEEE, 2013.

Abstract

The shrinking dimensions with advanced technologies pose yield challenges which require continuous enhancement of yield methodologies to quickly detect and fix the marginal layout features. In this paper, we present a practical approach to enhance the DFM and DEM capabilities suite provided by GLOBALFOUNDRIES for 28nm technology and beyond. The MDRT system has been implemented in the Product Lifecycle Management (PLM) system within GLOBALFOUNDRIES.

Details

Database :
OpenAIRE
Journal :
ASMC 2013 SEMI Advanced Semiconductor Manufacturing Conference
Accession number :
edsair.doi...........9d43bad0f5e6070b5fa38e100ca6e371
Full Text :
https://doi.org/10.1109/asmc.2013.6552799