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1. Total dose bias dependency and ELDRS effects in bipolar linear devices

Author

Yui, C. C, McClure, S. S, Rex, B. G, Lehman, J. M, Minto, T. D, and Wiedeman, M

Subjects
Space Radiation
Abstract

Total dose tests of several bipolar linear devices show sensitivity to both dose rate and bias during exposure. All devices exhibited Enhanced Low Dose Rate Sensitivity (ELDRS). An accelerated ELDRS test method for three different devices demonstrate results similar to tests at low dose rate. Behavior and critical parameters from these tests are compared and discussed.

Published
2002

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