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Two measures of motive to succeed were revised for administration to female ninth grade students (N = 71). Scores on Hermans' (1970) Prestatie Motivatie Test (PMT) yielded a high degree of internal consistency, comparable to that obtained with males, which was greater than that found for scores on the present version of Mehrabian's (1969) Resultant Achievement Motivation (RAM) Test. In separate validation analyses, scores on the PMT were observed to correlate positively and substantially with each of two measures of school achievement and with questionnaire data on school-related attitudes and behavior. Although the correlations of the RAM scores with achievement measures were in the same direction, they were weaker than those for the PMT scores. The relationships between the two measures of motive to succeed and various internal causal ascriptions were different and low for the two instruments. [ABSTRACT FROM PUBLISHER]

The article focuses on the concept of locus of control mediates the effects of achievement motivation on achievement behavior. According to a finding, locus of control is not a unitary variable. Internal ascriptions of causality for events which may result in success or in failure can be based on the constant, stable factor of ability or the fluctuating, unstable factor of effort. Thus, there are four internal attribution conditions, success to ability, success to effort, failure to lack of ability, and failure to lack of effort. It is the attribution view that persons with high achievement needs attribute success to the internal factors of ability and effort. Persons with low achievement needs attribute failure to lack of ability which is associated with two inhibitive tendencies, shame due to failure and the expectation of future failures. Achievement motivation is positively related to the attribution of success to ability and to effort and the attribution of failure to lack of effort. Achievement needs are inversely related to the attribution of failure to lack of ability. Both the attribution of success to ability and to effort are positively related to achievement activity.

This paper presents a method for evaluating the irradiance of a single freeform surface deviation under extended source illumination. The method takes advantage of a well-known concept, the pinhole image. First, the irradiance of the perturbed freeform surface under point source illumination is computed. Second, a pinhole image of the extended source is obtained by placing a small aperture (pinhole) on the freeform surface. Then, the extended source irradiance pattern change can be quickly calculated by convolving the pinhole image with the perturbed point source irradiance change. The method was experimentally verified, demonstrating the efficacy of the underlying concept. The proposed method alleviates the computational demands during extended source tolerancing, expediting the process.