Estimating the irradiance of a perturbed surface under an extended source.

This paper presents a method for evaluating the irradiance of a single freeform surface deviation under extended source illumination. The method takes advantage of a well-known concept, the pinhole image. First, the irradiance of the perturbed freeform surface under point source illumination is computed. Second, a pinhole image of the extended source is obtained by placing a small aperture (pinhole) on the freeform surface. Then, the extended source irradiance pattern change can be quickly calculated by convolving the pinhole image with the perturbed point source irradiance change. The method was experimentally verified, demonstrating the efficacy of the underlying concept. The proposed method alleviates the computational demands during extended source tolerancing, expediting the process.