Author: "Pinheiro, Rafael Bortolin" - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Pinheiro, Rafael Bortolin"' showing total 5 results

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5 results on '"Pinheiro, Rafael Bortolin"'

1. Unraveling structural and compositional information in 3D FinFET electronic devices

Author: Trombini, Henrique, Marmitt, Gabriel Guterres, Alencar, Igor, Baptista, Daniel Lorscheitter, Reboh, Shay, Mazen, Frédéric, Pinheiro, Rafael Bortolin, Sanchez, Dario Ferreira, Senna, Carlos Alberto, Archanjo, Bráulio Soares, Achete, Carlos Alberto, and Grande, Pedro Luis
Published: 2019
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2. Correlative HAADF-STEM and EDX-STEM Tomography for the 3D Morphological and Elemental Analysis of FinFET Semiconductor Devices

Author: Sorel, Julien, primary, Jacob, Martin, additional, Sanders, Toby, additional, Grenier, Adeline, additional, Pinheiro, Rafael Bortolin, additional, Mazen, Frederic, additional, Epicier, Thierry, additional, and Saghi, Zineb, additional
Published: 2018
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3. Multivariate Analysis and Compressed Sensing Methods for Spectroscopic Electron Tomography of Semiconductor Devices

Author: Jacob, Martin, primary, Sanders, Toby, additional, Bernier, Nicolas, additional, Grenier, Adeline, additional, Pinheiro, Rafael Bortolin, additional, Mazen, Frederic, additional, Bayle-Guillemaud, Pascale, additional, and Saghi, Zineb, additional
Published: 2018
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4. Multivariate Analysis and Compressed Sensing Methods for Spectroscopic Electron Tomography of Semiconductor Devices.

Author: Jacob, Martin, Sanders, Toby, Bernier, Nicolas, Grenier, Adeline, Pinheiro, Rafael Bortolin, Mazen, Frederic, Bayle-Guillemaud, Pascale, and Saghi, Zineb
Published: 2019
Full Text: View/download PDF

5. Correlative HAADF-STEM and EDX-STEM Tomography for the 3D Morphological and Elemental Analysis of FinFET Semiconductor Devices.

Author: Sorel, Julien, Jacob, Martin, Sanders, Toby, Grenier, Adeline, Pinheiro, Rafael Bortolin, Mazen, Frederic, Epicier, Thierry, and Saghi, Zineb
Published: 2019
Full Text: View/download PDF

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