169 results on '"Phang, J.C.H."'
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2. Quantitative imaging of local defects in very thin silicon dioxide films at low bias voltage by true oxide electron-beam-induced current
3. Investigation of Tunnel-Regenerated Multi-Active-Region Light-Emitting Diodes (TRMAR LED) by Scanning Thermal Microscopy (STHM)
4. Single contact optical beam induced currents
5. Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting device
6. Can physical analysis aid in device characterization?
7. Comparison between standard and near-field cathodoluminescence
8. Front- and backside investigations of thermal and electronic properties of semiconducting devices
9. Determination of secondary electron yield from insulators due to a low-kV electron beam
10. Application and modeling of single contact electron beam induced current technique on multicrystalline silicon solar cells
11. Characterization of MOS Transistors Using Dynamic Backside Reflectance Modulation Technique
12. Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current
13. Negative backside thermoreflectance modulation of microscale metal interconnects
14. Backside reflectance modulation of microscale metal interconnects
15. Mobile Diffractive Solid Immersion Lens Design for Backside Laser Based Fault Localization
16. Tester-Driven Dynamic Laser Stimulation for Hard Functional Failure
17. Combining Refractive Solid Immersion Lens and Pulsed Laser-Induced Technique for Integrated Circuit Failure Analysis
18. Determination of the local electric field strength near electric breakdown
19. Development, characterization and interface engineering of films for enhanced amorphous silicon solar cell performance
20. SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells
21. Laser Timing Probe with Frequency Mapping for Locating Signal Maxima
22. Subsurface Imaging of Multi-Level Integrated Circuits Using Scanning Electron Acoustic Microscopy
23. Finite element analyses assisted Scanning Joule Expansion Microscopy on interconnects for failure analysis and reliability investigations
24. Resolution and sensitivity enhancements of scanning optical microscopy techniques for integrated circuit failure analysis
25. Applications of scanning near-field photon emission microscopy
26. Advanced dynamic failure analysis on interconnects by vectorized Scanning Joule Expansion microscopy
27. Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplification
28. Effect of Refractive Solid Immersion Lens Parameters on the Enhancement of Laser Induced Fault Localization Techniques
29. Applications of Scanning Near-Field Photon Emission Microscopy
30. Combining Refractive Solid Immersion Lens and Pulsed Laser Induced Techniques for Effective Defect Localization on Microprocessors
31. Near-field detection of photon emission from silicon with 30nm spatial resolution
32. Effect of Refractive Solid Immersion Lens parameters on the enhancement of laser induced fault localization techniques
33. Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs
34. Scanning near-field photon emission microscopy
35. Localization of Cu/Low-k Interconnect Reliability Defects by Pulsed Laser Induced Technique
36. Near-IR Photon Emission Spectroscopy on Strained and Unstrained 60 nm Silicon nMOSFETs
37. Enhanced Detection Sensitivity with Pulsed Laser Digital Signal Integration Algorithm
38. Detectivity Optimization of InGaAs Photon Emission Microscope Systems
39. Analysis of premature breakdown in high-power devices using IBIC microscopy
40. Correlation of Flash Memory Defects Detected With Passive and Active Localization Techniques
41. Enhanced Pixel by Pixel Emissivity Correction for Thermal Microscopy
42. Characterization of Interconnect Defects Using Scanning Thermal Conductivity Microscopy
43. Near IR Continuous Wavelength Spectroscopy of Photon Emissions from Semiconductor Devices
44. Characterization of Interconnect Defects Due to Electromigration Using Scanning Thermal Microscopy
45. Determination of the local electric field strength by Energy dispersive Photon Emission Microscopy.
46. Electron beam induced temperature oscillation for qualitative thermal conductivity analysis by an SThM/ESEM-hybrid-system.
47. DC-Coupled Laser Induced Detection System for Fault Localization in Microelectronic Failure Analysis.
48. Detectivity Optimization of InGaAs Photon Emission Microscope Systems.
49. Analysis of E-field distributions within high-power devices using IBIC microscopy.
50. A review of near infrared photon emission microscopy and spectroscopy.
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