Detectivity Optimization of InGaAs Photon Emission Microscope Systems.

Authors :: Tan, S.L.
Yim, K.H.
Chan, D.S.H.
Phang, J.C.H.
Zhou, Y.
Balk, L.J.
Chua, C.M.
Koh, L.S.
Source :: 2006 13th International Symposium on the Physical & Failure Analysis of Integrated Circuits; 2006, p315-319, 5p
Publication Year :: 2006

Language :: English
ISBNs :: 9781424402052
Database :: Complementary Index
Journal :: 2006 13th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Publication Type :: Conference
Accession number :: 80804034
Full Text :: https://doi.org/10.1109/IPFA.2006.251053