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116 results on '"Phalippou, D."'

5. Observation by soft X-ray laser interferometry of Nb cathode surface evolution during very high electric field application

Author

Zeitoun-Fakiris, A., Boussoukaya, M., Zeitoun, Ph., Albert, F., Carillon, A., Jaegle, P., Jamelot, G., Klisnick, A., Ros, D., Sebban, S., Joyeux, D., and Phalippou, D.

Subjects
Electric fields -- Research, Field emission cathodes -- Research, Laser interferometers -- Usage, X-ray lasers -- Usage, Business, Electronics, Electronics and electrical industries
Abstract

We present the very first experiment allowing in situ observation of surface evolution during very high electric field application. This has been achieved by soft ([Lambda] = 21.2 nm) X-ray laser Fresnel two-mirror interferometry. The surface under study was a niobium planar cathode opposite to a stainless steel blade-like anode. The applied field range on the cathode was F [approximately equal to] O to 50 MV/m. The interferograms were single shots of 80 ps duration, allowing to probe the surface morphology quasi-instantaneously. The delay between two shots was 20 min while the electric field was kept on. The comparison of successive interferograms gives the Nb surface evolution over [approximately]2 h. Thus, we observed the appearance of defects of [approximately] 3 nm high and their evolution with time. These may be the precursors of the minute breakdown which occurred later on. This technique thus makes it possible to detect the preliminary stages of a discharge.

Published
1999

9. Nanometric deformations of thin Nb layers under a strong electric field using soft x-ray laser interferometry.

Author

Jamelot, G., Ros, D., Carillon, A., Rus, B., Mocek, T., Kozlová, M., Präg, A. R., Joyeux, D., Phalippou, D., Boussoukaya, M., Kalmykow, M., Ballester, F., and Jacques, E.

Subjects
NIOBIUM, NANOSTRUCTURED materials, ELECTRIC fields, ELECTROMAGNETIC fields, LASERS, TRANSITION metals, THIN films
Abstract

We present measurements of in situ nanometric-resolution topographical modifications of thin niobium layers subjected to strong electric fields. The Nb layers, deposited on a fused silica substrate, are interferometrically flash probed using soft x-ray laser (XRL) at the wavelength of 21.2 nm. Its pulses are reflected by the probed sample under grazing incidence angle, and the information about surface deformation is obtained by a Fresnel wave-front-division interferometer. It was experimentally established that the probing pulses at the soft x-ray wavelength do neither produce any measurable photoelectric-field emission, nor alter the topographical features of the probed surface. The examined Nb electrodes were periodically probed while the electric field was increased up to 80 MV/m, and alterations of their topographical characteristics with a resolution of ∼2 nm in the relief elevation were obtained. It was found that behavior of the Nb layer strongly depends on the polarity of the applied voltage. Only small modifications are observed with the Nb surface at the positive potential, whereas the negative potential induces significant transient surface perturbations, with peak-to-valley elevation differences ∼50 nm. The qualitative nature of these modifications was observed to be unrelated to intermittent parasitic breakdowns. [ABSTRACT FROM AUTHOR]

Published
2005
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11. Internal frequency conversion extreme ultraviolet interferometer using mutual coherence properties of two high-order-harmonic sources

Author

Dobosz, S., primary, Stabile, H., additional, Tortora, A., additional, Monot, P., additional, Réau, F., additional, Bougeard, M., additional, Merdji, H., additional, Carré, B., additional, Martin, Ph., additional, Joyeux, D., additional, Phalippou, D., additional, Delmotte, F., additional, Gautier, J., additional, and Mercier, R., additional

Published
2009
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15. Caractérisation spatio-temporelle d'un laser XUV injecté

Author

Goddet, J.-P., primary, Sebban, S., additional, Guilbaud, O., additional, Maynard, G., additional, Cros, B., additional, Gautier, J., additional, Zeitoun, Ph., additional, Valentin, C., additional, Tissandier, F., additional, Marchenko, T., additional, Lambert, G., additional, Benredjem, D., additional, Boudaa, A., additional, Klisnick, A., additional, Ros, D., additional, Kazamias, S., additional, Cassou, K., additional, Habib, J., additional, Jamelot, G., additional, Lagron, J.-C., additional, Joyeux, D., additional, De Rossi, S., additional, Phalippou, D., additional, Delmotte, F., additional, Ravet, M. F., additional, Calisti, A., additional, Mocek, T., additional, Kozlová, M., additional, and Jakubczak, K., additional

Published
2009
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16. Characterization of an OFI seeded soft x-ray laser

Author

Zeitoun, Ph., primary, Sebban, S., additional, Goddet, J. P., additional, Bridou, F., additional, Burgy, F., additional, Cros, B., additional, Douillet, D., additional, Gautier, J., additional, Guillbaud, O., additional, Jamelot, G., additional, Joyeux, D., additional, Kazamias, S., additional, Klisnick, A., additional, Maynard, G., additional, Morlens, A. S., additional, Phalippou, D., additional, Lefrou, T., additional, Ros, D., additional, and Rousseau, J. P., additional

Published
2007
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18. Homogeneous focusing with a transient soft X-ray laser for irradiation experiments

Author

Kazamias, S., primary, Cassou, K., additional, Guilbaud, O., additional, Klisnick, A., additional, Ros, D., additional, Plé, F., additional, Jamelot, G., additional, Rus, B., additional, Koslová, M., additional, Stupka, M., additional, Mocek, T., additional, Douillet, D., additional, Zeitoun, Ph., additional, Joyeux, D., additional, and Phalippou, D., additional

Published
2006
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22. Microscopie interférentielle X-UV de plasmas créés par laser

Author

Guilbaud, O., primary, Tang, H., additional, Joyeux, D., additional, Jamelot, G., additional, Klisnick, A., additional, Ros, D., additional, Phalippou, D., additional, Cassou, K., additional, Kado, M., additional, Nishikino, M., additional, Sukegawa, K., additional, Kishimoto, M., additional, Ishino, M., additional, Nagashima, K., additional, and Daido, H., additional

Published
2005
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26. Characterization of an OFI seeded soft x-ray laser.

Author

Zeitoun, Ph., Sebban, S., Goddet, J. P., Bridou, F., Burgy, F., Cros, B., Douillet, D., Gautier, J., Guillbaud, O., Jamelot, G., Joyeux, D., Kazamias, S., Klisnick, A., Maynard, G., Morlens, A. S., Phalippou, D., Lefrou, T., Ros, D., and Rousseau, J. P.

Published
2007
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27. Origin of Microstructures in Picosecond X-Ray Laser Beams.

Author

Nickles, P. V., Janulewicz, K. A., Guilbaud, O., Klisnick, A., Cassou, K., Kazamias, S., Ros, D., Jamelot, G., Joyeux, D., and Phalippou, D.

Abstract

Beam sections of transient collisional excitation (TCE) and optical field ionization (OFI) soft X-ray lasers exhibit highly contrasted intensity modulations forming complex patterns. We present model calculations that reproduce these experimental observations both qualitatively and quantitatively. The low spatial coherence, high longitudinal coherence and short pulse duration of the source are shown to control the visibility of the beam structures. Besides, simple relationships relating the spatial and temporal characteristics of the emitting source to the main features of the beam small-scale structures can be derived. [ABSTRACT FROM AUTHOR]

Published
2007
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30. State of the development of X-ray lasers and applications at LSAI

Author

ROS, D., primary, JAMELOT, G., additional, CARILLON, A., additional, JAEGLÉ, P., additional, KLISNICK, A., additional, ZEITOUN, P., additional, RUS, B., additional, JOYEUX, D., additional, PHALIPPOU, D., additional, BOUSSOUKAYA, M., additional, ZEITOUN-FAKIRIS, A., additional, ALBERT, F., additional, FOURCADE, P., additional, HUBERT, S., additional, SEBBAN, S., additional, LAGRON, J.-C., additional, and VANBOSTAL, L., additional

Published
2002
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34. Characterization of high intensity Ni-like X-ray lasers and their application experiment

Author

Tang, H. J., primary, Daido, H., additional, Suzuki, M., additional, Yamagami, S., additional, Nagai, K., additional, Norimatsu, T., additional, Mima, K., additional, Yamanaka, T., additional, Kato, Y., additional, Sasaki, A., additional, Hasegawa, N., additional, Wang, S., additional, Gu, Y., additional, Huang, G., additional, Carillon, A., additional, Ros, D., additional, Fourcade, P., additional, Jamelot, G., additional, Joyeux, D., additional, Phalippou, D., additional, Murai, K., additional, Butzbach, R., additional, Uschmann, I., additional, Förster, E., additional, Namikawa, K., additional, Tai, R., additional, Koike, F., additional, Takenaka, H., additional, Zhang, G., additional, and Choi, I. W., additional

Published
2001
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35. Recent Progress on the Understanding of the Transient Ni-like Ag X-ray Laser at 13.9 nm at LULI facilities.

Author

Ros, D., Klisnick, A., Joyeux, D., Phalippou, D., Guilbaud, O., Kuba, J., Carillon, A., Jamelot, G., Smith, R., Edwards, M., Strati, F., Tallents, G. J., Daido, H., Tang, H., Neumeyer, P., Urescu, D., Kühl, T., Chanteloup, J.-C., and Bouhouch, K.

Subjects
X-ray lasers, ARGON lasers
Abstract

This paper summarises our recent progress achieved in the characterisation and understanding of the Ni-like Ag transient X-ray laser pumped under traveling wave irradiation. We carried out two experiments at the LULI CPA laser facility. Several diagnostics of the plasma emission at the XRL wavelength or in the keV range indicate the presence of small-scale spatial structures in the emitting XRL source. Single-shot Fresnel interference patterns at 13.9 nm were successfully obtained with a good fringe visibility. For the first time we obtained plasma images with a high spatial resolution about 1 µm, showing the effects of pumping parameters on the X-ray laser far-field. [ABSTRACT FROM AUTHOR]

Published
2002

36. Multi-millijoule, highly coherent X-ray laser at 21 nm as a routine tool for applications.

Author

Rus, B., Mocek, T., Präg, A. R., Kozlová, M., Hudecˇek, M., Jamelot, G., Lagron, J.-C., Carillon, A., Ros, D., Joyeux, D., and Phalippou, D.

Subjects
X-ray lasers, INDUSTRIAL applications
Abstract

A recently developed double-pass, deeply saturated Ne-like Zn X-ray laser at 21.2 nm, is presented. The system consists of a 3-cm long plasma anda half cavity constituted by a flat multilayer mirror located at 8.5 mm. The pump sequence includes a weak prepulse and a main heating pulse, delivering ∼500 J of net energy at 1.315 µm, in pulses with a length of ∼450 ps. A novel prepulse illumination geometry is employed, in which the prepulse beam generates a wide preplasma buffer into which subsequently a much more tightly focused main beam is coupled. The emitted X-ray beam is narrowly collimated and possesses a remarkably high spatial quality. In the half-cavity regime, the system provides an output energy of about 4 m J, corresponding to peak power of 40 MW. A fully routine operation of the half-cavity has been achieved, making it possible to perform, without any realignment or manual intervention, about 100 shots with one multilayer mirror. [ABSTRACT FROM AUTHOR]

Published
2002

37. Interferometric probing of thin Niobium layers under high electrical field using the zinc X-ray laser at PALS.

Author

Mocek, T., Ros, D., Rus, B., Joyeux, D., Präg, A. R., Kozlová, M., Carillon, A., Phalippou, D., Ballester, F., Jacques, E., Boussoukaya, M., and Jamelot, G.

Subjects
NIOBIUM, INTERFEROMETRY, X-ray lasers
Abstract

We report on interferometric investigation of perturbed surfaces under high electric field by using the 21.2 nm zinc soft X-ray laser operating in a half cavity configuration. DC electric fields of up to 106 MV/m were applied to the surface of a niobium sample. Both positive and negative polarizations of the electric field were examined. Single shot, high-quality X-ray interferograms were recorded with a double-mirror Fresnel interferometer and surface maps were obtained from the experimental data by holographic reconstruction. [ABSTRACT FROM AUTHOR]

Published
2002

38. An interferometric microimaging system for probing laser plasmas with an X-ray laser.

Author

Joyeux, D., Mercier, R., Phalippou, D., Mullot, M., Hubert, S., Zeitoun, P., Carillon, A., Klisnick, A., Jamelot, G., Be´chir, E., and de Lacheze-Murel, G.

Subjects
X-ray microscopy, LASER plasmas, INTERFEROMETRY, IMAGING systems
Abstract

The probing of dense (10[sup 21]-10[sup 22] electrons/cm³) laser plasmas produced by high energy pulsed lasers usually makes use of X-ray emission imaging, or, more recently, of microradiography, i. e. of absorption imaging. However, it is well known that probing the index of refraction would bring much valuable informations. As far as index is concerned, interferometry is the choice method. However, the plasma context makes necessary to use for probing a very large brilliance, single pulse source, delivering energetic radiation, such as a soft X-ray laser. We report the design of a dedicated interferometric microimaging system, based on a Fresnel bimirror interferometer, associated with an off-axis spherical mirror, aspherized for diffraction limited (DL) imaging. In the first realization, the ideal mirror shape was approximated by a torus, making the system not diffraction limited. In a second step (currently in progress), a nearly perfect system will be realized, for diffraction limited resolution. The design and the realization techniques will be discussed and the first tests of the toroïdal system will be presented. [ABSTRACT FROM AUTHOR]

Published
2000

39. Interferometric soft X-ray index measurements: Progress of system design and recent results.

Author

Joyeux, D., Polack, F., and Phalippou, D.

Subjects
INTERFEROMETRY, X-ray equipment
Abstract

We present the most recent evolution of our interferometric system for index measurements. It was tested by recording the index dispersion of carbon and silver on both sides of absorption edges, in the water window region. Its current performances and limitations are discussed in light of these results. [ABSTRACT FROM AUTHOR]

Published
2000

42. Usefulness of X-ray lasers for science and technology

Author

Jamelot, G., primary, Carillon, A., additional, Jaegle, P., additional, Klisnick, A., additional, Ros, D., additional, Zeitoun, P., additional, Fourcade, P., additional, Hubert, S., additional, Lagron, J.C., additional, Vanbostal, L., additional, Sebban, S., additional, Albert, F., additional, Agostini, P., additional, Garzella, D., additional, Breger, P., additional, Belsky, A., additional, Kamenskikh, I., additional, Joyeux, D., additional, Phalippou, D., additional, Boussoukaya, M., additional, Zeitoun-Fakiris, A., additional, de Lacheze-Murel, G., additional, and Bechir, E., additional

Published
1999
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43. Investigation of strong electric-field induced surface phenomena by soft X–UV laser interferometry

Author

Zeitoun, Ph., primary, Albert, F., additional, Jaeglé, P., additional, Joyeux, D., additional, Boussoukaya, M., additional, Carillon, A., additional, Hubert, S., additional, Jamelot, G., additional, Klisnick, A., additional, Phalippou, D., additional, Lagron, J.C, additional, Ros, D., additional, Sebban, S., additional, and Zeitoun-Fakiris, A., additional

Published
1998
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