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Observation by soft X-ray laser interferometry of Nb cathode surface evolution during very high electric field application

Authors :
Zeitoun-Fakiris, A.
Boussoukaya, M.
Zeitoun, Ph.
Albert, F.
Carillon, A.
Jaegle, P.
Jamelot, G.
Klisnick, A.
Ros, D.
Sebban, S.
Joyeux, D.
Phalippou, D.
Source :
IEEE Transactions on Dielectrics and Electrical Insulation. August, 1999, Vol. 6 Issue 4, p418, 4 p.
Publication Year :
1999

Abstract

We present the very first experiment allowing in situ observation of surface evolution during very high electric field application. This has been achieved by soft ([Lambda] = 21.2 nm) X-ray laser Fresnel two-mirror interferometry. The surface under study was a niobium planar cathode opposite to a stainless steel blade-like anode. The applied field range on the cathode was F [approximately equal to] O to 50 MV/m. The interferograms were single shots of 80 ps duration, allowing to probe the surface morphology quasi-instantaneously. The delay between two shots was 20 min while the electric field was kept on. The comparison of successive interferograms gives the Nb surface evolution over [approximately]2 h. Thus, we observed the appearance of defects of [approximately] 3 nm high and their evolution with time. These may be the precursors of the minute breakdown which occurred later on. This technique thus makes it possible to detect the preliminary stages of a discharge.

Details

ISSN :
10709878
Volume :
6
Issue :
4
Database :
Gale General OneFile
Journal :
IEEE Transactions on Dielectrics and Electrical Insulation
Publication Type :
Academic Journal
Accession number :
edsgcl.56692234