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Your search keyword '"Peng Po-Lin"' showing total 9 results
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9 results on '"Peng Po-Lin"'

4. Low-Capacitance SCR for On-Chip ESD Protection with High CDM Tolerance in 7nm Bulk FinFET Technology

Author

Ming-Hsiang Song, Yu-Ti Su, Ming-Fu Tsai, Jam-Wem Lee, Li-Wei Chu, Kuo-Ji Chen, and Peng Po-Lin

Subjects
Materials science, Parasitic capacitance, Robustness (computer science), Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Hardware_PERFORMANCEANDRELIABILITY, Capacitance, Hardware_LOGICDESIGN
Abstract

A low-capacitance silicon-controlled rectifier for high speed I/O pad protection is implemented with TSMC 7nm bulk FinFET technology. It can achieve much higher ESD robustness per capacitance with better dynamic on-resistance and faster turn-on speed for CDM protection as compared to the prior art.

Published
2019
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5. ESD protection Diode with Guard Ring Layout Optimized for Latch-up Immunity Enhancement in FinFET technology

Author

Kuo-Ji Chen, Tzu-Heng Chang, Peng Po-Lin, Li-Wei Chu, Kai-Ping Huang, Jam-Wem Lee, Ming-Hsiang Song, and Yi-Feng Chang

Subjects
Materials science, business.industry, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit, law.invention, CMOS, law, Robustness (computer science), Guard ring, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Hardware_ARITHMETICANDLOGICSTRUCTURES, business, Hardware_LOGICDESIGN, Diode
Abstract

A novel ESD dual diode with stronger latch-up robustness has been proposed in FinFET technology. By inserting PW/NW straps, the proposed ESD diode can be built without changing DC-IV and ESD characteristics of conventional ESD diode. The experimental and simulation results demonstrate that the proposed structure has been successfully verified in FinFET CMOS platform.

Published
2019
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8. Novel SCR structure for power supply protection in FinFET technology

Author

Chia-Wei Hsu, Kuo-Ji Chen, Ming-Hsiang Song, Jam-Wem Lee, Peng Po-Lin, Yi-Feng Chang, Li-Wei Chu, and Wun-Jie Lin

Subjects
010302 applied physics, Engineering, Hardware_MEMORYSTRUCTURES, Electrostatic discharge, business.industry, Electrical engineering, 020206 networking & telecommunications, Low leakage, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, 01 natural sciences, Clamp, Robustness (computer science), 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, business, Hardware_LOGICDESIGN
Abstract

A FinFET SCR embedded ESD clamp for power supply protection with low leakage current is demonstrated. The proposed clamp is suitable for low power applications since it reduces ∼87% of leakage current per bigFET width and improves ESD robustness to ∼2X per footprint compared to the conventional RC-triggered clamp.

Published
2017
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