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A study was conducted to analyze double peak phenomenon in superconducting tunnel junction x-ray detectors. Square junctions were fabricated by the dc-sputtering of aluminum surface by photolithographic patterning using reactive ion etching. Results indicated that the double peak correlated with the dynamics of quasiparticles resulting from x-ray absorption events. In addition, the double peak phenomenon was influenced by by bias voltage and magnetic history.

A study was conducted to examine superconducting tunnel junctions supporting various multilayer structures by low temperature scanning electron microscopy. A trapping layer from utilized to eliminate the response of the base electrode in the junctions. Results indicated the possibility of separating different quasiparticle loss processes by determining the quasiparticle lifetimes of junctions with various film thicknesses at different temperatures.