11 results on '"Naruoka, Hideki"'
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2. Study of Cu and Co gettering mechanism using radioactive isotope tracers
3. Thickness dependent integrity of gate oxide on SOI
4. Analysis of Nitrogen State on MOS Interface of 4H-SiC m-Face after Nitric Oxide Post Oxidation Annealing (NO-POA)
5. Impact of surface morphology above threading dislocations on leakage current in 4H-SiC diodes
6. Relationship between threading dislocation and leakage current in 4H-SiC diodes
7. Analysis of surface morphology at leakage current sources of 4H–SiC Schottky barrier diodes
8. Surface defects on SOI wafers and their influence on device characteristics
9. Effective Metal Gettering Technique using Polysilicon Substrate Contact Structure for SOI Devices
10. Influence of silicon surface integrity on device yield
11. Influence of silicon surface integrity on device yield.
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