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2. Time-dependent degradation of hydrogen-terminated diamond MESFETs

3. Charge Trapping in GaN Power Transistors: Challenges and Perspectives

4. Hydrogen-terminated diamond MESFETs: operating principles, static and dynamic performance, and reliability

5. Hot-Electron Effects in AlGaN/GaN HEMTs Under Semi-ON DC Stress

10. Degradation of GaN-Based Lateral and Vertical Devices—Challenges and Perspectives

11. Degradation physics of GaN-based lateral and vertical devices

13. Degradation physics of GaN-based lateral and vertical devices

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