Back to Search
Start Over
Degradation physics of GaN-based lateral and vertical devices
- Source :
- Proceedings of SPIE; March 2019, Vol. 10918 Issue: 1 p1091817-1091817-10
- Publication Year :
- 2019
Details
- Language :
- English
- ISSN :
- 0277786X
- Volume :
- 10918
- Issue :
- 1
- Database :
- Supplemental Index
- Journal :
- Proceedings of SPIE
- Publication Type :
- Periodical
- Accession number :
- ejs50005916
- Full Text :
- https://doi.org/10.1117/12.2511145