11 results on '"Motika, F."'
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2. Structural and functional test of IBM System z10 chips
3. Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment.
4. Diagnostic techniques for the IBM S/390 600 MHz G5 microprocessor.
5. Testing VLSI chips with weighted random patterns.
6. Diagnosis and characterization of timing-related defects by time-dependent light emission.
7. Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment.
8. Application and analysis of IDDQ diagnostic software.
9. A logic chip delay-test method based on system timing
10. Application and analysis of IDDQ diagnostic software
11. Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment
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