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Testing VLSI chips with weighted random patterns.
- Source :
- International Symposium on VLSI Technology, Systems & Applications; 1989, p149-154, 6p
- Publication Year :
- 1989
Details
- Language :
- English
- Database :
- Complementary Index
- Journal :
- International Symposium on VLSI Technology, Systems & Applications
- Publication Type :
- Conference
- Accession number :
- 92190716
- Full Text :
- https://doi.org/10.1109/VTSA.1989.68602