Search

Depending on processing methods and conditions, cellulose nanocrystal (CNC) films exhibit linear birefringence or selective Bragg reflection. The latter means reflection of light with left-handed circular polarization (LCP) due to CNC in a helicoidal microstructure of the same handedness. Herein, glass-supported CNC/polyethylene glycol (CNC/PEG) composite films with PEG concentrations in the range of 0-30% w/w with selective Bragg reflection at wavelengths from 440 to 550 nm are prepared. A modular device comprised of a dip-coated birefringent CNC-glass sample sandwiched between two CNC/PEG-glass samples shows different responses to light with LCP and to light with right-handed circular polarization (RCP). The device suppresses selective Bragg reflection from the rear (front) CNC/PEG sample for incident light with LCP (RCP), even when the birefringent film does not meet the condition for a halfwave plate. This behavior resembles the performance of optical diodes for circular polarization. Polarization properties of composite films and optical diodes in terms of degree of polarization and ellipticity are discussed within the Stokes-Mueller formalism. Electromagnetic simulations of Mueller matrices reveal the equivalence of modular and in-tandem film approaches of optical diodes. The handedness of circular polarization of light is reversed by a modular device comprised of a dip-coated birefringent cellulose nanocrystal (CNC) film sandwiched by two CNC/polyethylene glycol composite films. Asymmetric forward and backward propagation of circular propagation resembles an optical diode at wavelengths of selective Bragg reflection.image (c) 2023 WILEY-VCH GmbH, Funding Agencies|Conacyt-Mexico for doctoral studies; Swedish Government Strategic Research Area in Materials Science on Advanced Functional Materials at Linkoeping University [782810]; Conacyt [2009-00971, N-295261]; [LN-254119]

Featured Application The analysis of the transmission of Mueller matrices facilitates studies of optical activity in samples that also exhibit linear anisotropy and depolarization and may have a multilayered structure. Such studies are important for the development of applications in chiroptics. Optical chirality, in terms of circular birefringence and circular dichroism, is described by its electromagnetic and magnetoelectric material tensors, and the corresponding optical activity contributes to the Mueller matrix. Here, spectroscopic ellipsometry in the spectral range 210-1690 nm is used to address chiral phenomena by measuring Mueller matrices in transmission. Three approaches to determine chirality parameters are discussed. In the first approach, applicable in the absence of linear polarization effects, circular birefringence and circular dichroism are evaluated directly from elements of a Mueller matrix. In the second method, differential decomposition is employed, which allows for the unique separation of chirality parameters from linear anisotropic parameters as well as from depolarization provided that the sample is homogeneous along the optical path. Finally, electromagnetic modeling using the Tellegen constitutive relations is presented. The last method also allows structural effects to be included. The three methods to quantify optical chirality are demonstrated for selected materials, including sugar solutions, alpha-quartz, liquid crystals, beetle cuticle, and films of cellulose nanocrystals., Funding Agencies|Swedish Government Strategic Research Area in Materials Science on Functional Materials at Linkoping University [SFO-Mat-LiU 2009-00971]

Chiral nanocrystalline cellulose (NCC) free-standing films were prepared through slow evaporation of aqueous suspensions of cellulose nanocrystals in a nematic chiral liquid crystal phase. Mueller matrix (MM) spectroscopic ellipsometry is used to study the polarization and depolarization properties of the chiral films. In the reflection mode, the MM is similar to the matrices reported for the cuticle of some beetles reflecting near circular left-handed polarized light in the visible range. The polarization properties of light transmitted at normal incidence for different polarization states of incident light are discussed. By using a differential decomposition of the MM, the structural circular birefringence and dichroism of a NCC chiral film are evaluated., Funding Agencies|Knut and Alice Wallenberg foundation; Swedish Research Council; Carl Tryggers foundation; Swedish Government Strategic Research Area in Materials Science on Functional Materials at Linkoping University [2009-00971]; Brazilian agency FAPESP; Brazilian agency CNPq; FAPESP [2014/12424-2]

The averaged complex dielectric function =2+ /3 of polycrystalline Ti2AlN, Ti2AlC,Nb2AlC, Ti0.5,Nb0.52AlC, and Ti3GeC2 was determined by spectroscopic ellipsometry coveringthe mid infrared to the ultraviolet spectral range. The dielectric functions and correspond tothe perpendicular and parallel dielectric tensor components relative to the crystallographic c-axis ofthese hexagonal compounds. The optical response is represented by a dispersion model with Drude–Lorentz and critical point contributions. In the low energy range the electrical resistivity is obtainedfrom the Drude term and ranges from 0.48 m for Ti3GeC2 to 1.59 m for Ti0.5,Nb0.52AlC.Furthermore, several compositional dependent interband electronic transitions can be identified. Forthe most important ones, Im shows maxima at: 0.78, 1.23, 2.04, 2.48, and 3.78 eV for Ti2AlN;0.38, 1.8, 2.6, and 3.64 eV for Ti2AlC; 0.3, 0.92, and 2.8 eV in Nb2AlC; 0.45, 0.98, and 2.58 eV inTi0.5,Nb0.52AlC; and 0.8, 1.85, 2.25, and 3.02 eV in Ti3GeC2., Original Publication: Arturo Mendoza-Galvan, M Rybka, Kenneth Järrendahl, Hans Arwin, Martin Magnuson, Lars Hultman and Michel Barsoum, Spectroscopic ellipsometry study on the dielectric function of bulk Ti2AlN,Ti2AlC, Nb2AlC, (Ti0.5,Nb0.5)2AlC, and Ti3GeC2 MAX-phases, 2011, Journal of Applied Physics, (109), 013530. http://dx.doi.org/10.1063/1.3525648 Copyright: American Institute of Physics http://www.aip.org

MAX-phases are compounds with the chemical formula Mn+1AXn where M is a transition metal, A is an element from column 13 to 16 in the periodic system and X represents C or N and n = 1, 2 or 3. These materials are potentially technologically important as they show unique refractory and other physical properties due to the combination of metals and ceramics. From a fundamental point of view the band structure of these materials are of interest and optical reference data are important to determine. Herein we report, for the first time, on the optical properties of NbTiAlC, Nb2AlC, TiSC2, Cr2GeC, TiGeC2, Ti2AlC, and Ti2AlN by spectroscopic ellipsometry in the 0.03 to 6.0 eV spectral range. The ellipsometric data in the infrared range show features corresponding to Fano modes indicating the presence of a thin oxide layer a few nm thick. The optical response of these MAX-phases is represented by a Drude-Lorentz model. Thus, in the low energy range the electrical conductivity through the Drude term is evaluated and two or three interband electronic transitions which are compositional dependent can be identified at photon energies in the visible-ultraviolet range 1.0-6.0 eV.