Search

Your search keyword '"Memory (Computers) -- Testing"' showing total 23 results
Start Over Descriptor "Memory (Computers) -- Testing"
23 results on '"Memory (Computers) -- Testing"'

1. Matrix-based codes for adjacent error correction

Author

Argyrides, Costas A., Reviriego, Pedro, Pradhan, Dhiraj K., and Maestro, Juan Antonio

Subjects
Failure mode and effects analysis -- Methods, Semiconductor industry -- Research, Reliability (Engineering) -- Evaluation, Error-correcting codes -- Analysis, Memory (Computers) -- Properties, Memory (Computers) -- Testing, Semiconductor industry, Semiconductor memory, Business, Electronics, Electronics and electrical industries
Published
2010

4. Optimal policies with decreasing probability of imperfect maintenance

Author

Shey-Huie Sheu, Yu-Bin Lin, and Gwo-Liang Liao

Subjects
Memory (Computers) -- Maintenance and repair, Memory (Computers) -- Testing, Memory (Computers) -- Research, Semiconductor memory, Business, Electronics, Electronics and electrical industries
Abstract

A study is conducted which applies periodic preventive maintenance to three repair models, major repaired, minimal repaired, or fixed until perfect preventive maintenance upon failure. Two types of preventive maintenance are performed, namely imperfect preventive maintenance, and perfect preventive maintenance.

Published
2005

5. Test generation and optimization for DRAM cell defects using electrical simulation

Author

Ars, Zaid al and Goor, Ad J. van de

Subjects
DRAM, Semiconductor memory, Integrated circuit design, Circuit designer, Dynamic random access memory -- Testing, Dynamic random access memory -- Research, Dynamic cell -- Testing, Dynamic cell -- Research, Memory (Computers) -- Research, Memory (Computers) -- Testing, Circuit design -- Research
Published
2003

6. A framework for testing special-purpose memories

Author

Sidorowicz, Piotr R. and Brzozowski, Janusz A.

Subjects
Semiconductor memory, Standard IC, Memory (Computers) -- Testing, Memory (Computers) -- Design and construction, Memory (Computers) -- Research, Integrated circuits -- Research, Integrated circuits -- Design and construction, Integrated circuits -- Testing, Semiconductor chips
Published
2002

7. Generation of sign Walsh spectra from disjoint cubes of Boolean functions

Author

Falkowski, Bogdan J. and Kannurao, Sudha

Subjects
Memory (Computers) -- Testing, Computers, Electronics, Engineering and manufacturing industries
Abstract

A new algorithm is given that converts a reduced representation of Boolean functions in the form of disjoint cubes to sign Walsh spectra. Since the known algorithms that generate sign Walsh spectra always start from the truth table of Boolean functions, the method presented computes faster with a smaller computer memory. The method is especially efficient for such Boolean functions that are described by only few disjoint cubes. Keywords: Sign Walsh transforms; Boolean functions; Spectral transforms

Published
2002

10. New methods test small memory arrays: memory blocks distributed throughout an IC pose test challenges that traditional memory BIST doesn't address. (Device Test)

Author

Boyer, Jeff and Press, Ron

Subjects
Semiconductor industry, Semiconductor memory, Semiconductor industry -- Product information, Memory (Computers) -- Testing, Memory (Computers) -- Evaluation, Memory (Computers) -- Product information
Abstract

As IC geometries shrink, the large, consolidated memory blocks within ICs are giving way to tens or even hundreds of smaller memory arrays distributed throughout each chip. These arrays serve […]

Published
2003

11. Greased chipsets

Author

Laing, Gordon

Subjects
Computers -- Circuits, Memory (Computers) -- Testing
Published
2000

14. JEDEC, memory test lab square off over specs

Author

Robertson, Jack

Subjects
Semiconductor memory, Semiconductor industry, Computer Memory Test Labs -- Standards, JEDEC Solid State Technology Association -- Standards, Memory (Computers) -- Testing, Semiconductor industry -- Standards, Semiconductor industry -- Testing
Published
2003

16. Why Teradyne thinks it can recapture Japan

Author

Waller, Larry and Cohen, Charles L.

Subjects
Teradyne Inc. (Boston, Massachusetts) -- Marketing, Semiconductor production equipment industry -- International aspects, Semiconductor industry -- Japan, Automatic testing equipment -- Marketing, Integrated circuits -- Testing, Memory (Computers) -- Testing
Published
1986

17. Teradyne's big gamble in test equipment

Subjects
Teradyne Inc. (Boston, Massachusetts) -- Product introduction, Semiconductor production equipment industry -- Product introduction, Automatic testing equipment -- Product introduction, Semiconductor industry -- Innovations, Memory (Computers) -- Testing, Integrated circuits -- Testing
Published
1986

18. MoSys 1T-SRAM IP Ships in Hudson Soft's Video Game Controller

Subjects
Semiconductor memory, Contract agreement, Hudson Soft Ltd. -- Contracts, MoSys Inc. -- Contracts, MoSys 1T-SRAM (Semiconductor memory) -- Testing -- Contracts, Memory (Computers) -- Testing, Computer software industry -- Contracts
Abstract

WIRELESS NEWS-(C)1999-2005 10Meters - http://www.10meters.com MoSys, a provider of high density SoC embedded memory solutions announced that Hudson Soft Co., a manufacturer of game software and entertainment equipment, successfully verified […]

Published
2005

20. Teredyne, Mitsubishi near deal

Subjects
Semiconductor industry, Semiconductor memory, Contract agreement, RAM, Mitsubishi Electric Corp. -- Contracts, Teradyne Inc. -- Contracts, Memory (Computers) -- Testing, Semiconductor industry -- Contracts, Memory, Random access memory -- Testing, Contracts
Abstract

Teradyne, Mitsubishi Near Deal TOKYO -- Teradyne is close to signing a deal with Mitsubishi Electric for 26 high-speed memory test systems in a deal said to be valued at […]

Published
1988

21. Bubble memory gets NASA check for use in space

Subjects
United States. National Aeronautics and Space Administration -- Standards, Avionics -- Innovations, Memory (Computers) -- Testing, Computer storage devices -- Testing
Published
1977

22. A quick march checks memory

Author

Laurino, A. James

Subjects
microprocessors, Computer programming -- Methods, Memory (Computers) -- Testing, Computer storage devices -- Testing
Published
1978

23. Memory tester runs at 25MHz

Author

Waller, Larry

Subjects
Electric testing, Memory (Computers) -- Testing, Computer storage devices -- Testing
Published
1978

Catalog

Books, media, physical & digital resources
See catalog results