Neighborhood pattern-sensitive fault testing and diagnostics for random-access memories

Subjects

Subjects :

Semiconductor memory
Standard IC
Memory (Computers) -- Testing
Memory (Computers) -- Research
Integrated circuits -- Design and construction
Integrated circuits -- Research
Semiconductor chips

Details

ISSN :

02780070

Volume :

21

Issue :

11

Database :

Gale General OneFile

Journal :

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Publication Type :

Academic Journal

Accession number :

edsgcl.95922392