Search

Your search keyword '"Meisenheimer, T. L."' showing total 13 results

Search Constraints

Start Over You searched for: Author "Meisenheimer, T. L." Remove constraint Author: "Meisenheimer, T. L."
13 results on '"Meisenheimer, T. L."'

Search Results

1. Effects of oxide traps, interface traps, and ‘‘border traps’’ on metal-oxide-semiconductor devices.

2. Analysis of TID Process, Geometry, and Bias Condition Dependence in 14-nm FinFETs and Implications for RF and SRAM Performance

5. Radiation-Induced Charge Trapping in Thin. A1[sub2]O[sub3]/SiO[subx]N[suby]/Si( 100) Gate Dielectric Stacks.

6. Long-Term Reliability Degradation of Ultrathin Dielectric Films Due to Heavy-Ion Irradiation.

12. A new method for quantification of tremors in mice.

13. Cyanide-induced neurotoxicity: role of neuronal calcium.

Catalog

Books, media, physical & digital resources