124 results on '"McGahan, William A."'
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2. High SUVmax on routine pre-operative FDG-PET predicts early recurrence in pancreatic and peri-ampullary cancer
3. Fibroblast Activation Protein Is Overexpressed on Both Stromal and Epithelial Cells Before Pancreatic Ductal Adenocarcinoma: Implications for Early Diagnosis on 68Ga-FAPI-PET/CT.
4. Determining the CA19-9 concentration that best predicts the presence of CT-occult unresectable features in patients with pancreatic cancer: A population-based analysis
5. Individual Learning Strategies and Choice in Student-Generated Multimedia
6. Questionable Benefit of Visual and Peer Mediated Learning on Overall Learning Outcomes of a First-Year Physiology Course
7. Benign multi‐cystic peritoneal mesothelioma discovered at the time of acute appendicitis: a rare pathology in association with a common disease
8. Seaweed food bolus: A rare cause for small bowel obstruction
9. Solutions of the heat conduction equation in multilayers for photothermal deflection experiments
10. Materials Characterization
11. Use of artificial neural networks to predict thickness and optical constants of thin films from reflectance data
12. Magneto-optical Kerr effect and perpendicular magnetic anisotropy of evaporated and sputtered Co/Pt multilayer structures.
13. Kerr effect of two-medium layered systems.
14. Sputtering pressure effect on microstructure of surface and interface, and on coercivity of Co/Pt multilayers.
15. Optical and magneto-optical characterization of TbFeCo thin films in trilayer structures.
16. Enhancement of magneto-optical Kerr effects.
17. Magneto-optic and optical characterization of Tb/Co compositionally modulated amorphous films.
18. Normal-incidence spectroscopic ellipsometry and polarized reflectometry for measurement and control of photoresist critical dimension
19. Photomask ADI, AEI, and QA measurements using normal incidence optical CD metrology.
20. Individual Learning Strategies and Choice in Student-Generated Multimedia
21. Integrated reflectance for monitoring silicon oxynitride antireflective coatings on a CVD cluster tool.
22. Integrated measurement of Ti and TiN thickness and optical constants using reflectance data through a vacuum chamber window
23. Integrated reflectance for monitoring silicon oxynitride antireflective coatings on a CVD cluster tool
24. Optical and thermal properties of amorphous hydrogenated carbon thin films
25. Thickness and index measurement of transparent thin films using neural network processed reflectance data
26. Characterizing optical properties of red, green, and blue color filters for automated film-thickness measurement
27. Oxygen plasma asher contamination: An analysis of sources and remedies
28. Combined spectroscopic ellipsometry and reflectometry for advanced semiconductor fabrication metrology
29. Optical characterization of polycrystalline silicon thin films
30. Electromagnetic Applications of Intermetallic Compounds
31. Parametric Dispersion Models for the Index of Refraction of Transparent Materials
32. Modified Forouhi and Bloomer dispersion model for the optical constants of amorphous hydrogenated carbon thin films
33. Optical analysis of complex multilayer structures using multiple data types
34. Optical Characterization and Modeling of Amorphous Hydrogenated Carbon Films
35. Carbon overcoats with controlled properties: non-destructive ellipsometry evaluation
36. Ex situ variable angle spectroscopic ellipsometry studies of electron cyclotron resonance etching of Hg1−xCdxTe
37. Electron cyclotron resonance etching of semiconductor structures studied by in-situ spectroscopic ellipsometry
38. Techniques for ellipsometric measurement of the thickness and optical constants of thin absorbing films
39. Thermal characterization of thin films by photothermally induced laser beam deflection
40. In situ and Ex situ Applications of Spectroscopic Ellipsometry
41. Thermal diffusivity measurements by photothermal laser beam deflection (PTD): data analysis using the Levenberg—Marquardt algorithm
42. Optical characterization of polycrystalline silicon thin films.
43. Combined spectroscopic ellipsometry and reflectometry for advanced semiconductor fabrication metrology.
44. Optical analysis of complex multilayer structures using multiple data types.
45. Modified Forouhi and Bloomer dispersion model for the optical constants of amorphous hydrogenated carbon thin films.
46. Degradation of thin films in low earth orbit and comparisons with laboratory simulation.
47. Ellipsometric measurement of the optical properties and electrical conductivity of indium tin oxide thin films.
48. Optimization of quadrilayer structures for various magneto-optical recording materials
49. Optical and Magneto-optical modeling of Ultra-thin Film Multilayers
50. Variable angle of incidence analysis of magneto‐optic multilayers
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