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7. A G-Band Packaged Amplified Noise Source Using SiGe BiCMOS 55-nm Technology

10. Challenges to measure RF noise and intermodulation performances of mmW/THz devices

11. Filtre patch bi-bande 180/270 GHz en technologie BiCMOS 55 nm

12. Filtre patch à structure de type CSRR en technologie BiCMOS 55 nm

13. Tuner intégré large bande en gamme de fréquences millimétriques pour la caractérisation en technologie BiCMOS 55 nm

14. Kit d'étalonnage TRL pour la caractérisation sub-mmWave sous pointes de InP-HEMT

20. Fabrication, and Direct Current and cryogenic analysis of SF6-treated AlGaN/GaN Schottky barrier diodes.

22. mm-Wave Through-Load Element for On-Wafer Measurement Applications

25. Development of a Millimeter-Long Travelling Wave THz Photomixer

26. Analog/RF performance of multichannel SOI MOSFET

27. Improved characterization methology for MOSFETs up to 220 GHz

29. High-frequency and noise performances of 65-nm MOSFET at liquid nitrogen temperature

30. Design of mm-Wave Slow-Wave-Coupled Coplanar Waveguides

32. Highly Tunable High-Q Inversion-Mode MOS Varactor in the 1–325-GHz Band

38. Premier Système de Mesure Petit Signaux Deux Ports Complètement Intégré en Bande G

39. A converging route towards very high frequency, mechanically flexible, and performance stable integrated electronics.

42. Dielectric dispersion of BaSrTiO3 thin film from centimeter to submillimeter wavelengths.

47. High performance CMOS with enhanced property of mechanical flexibility

48. RF and broadband noise investigation in high-k/metal gate 28-nm CMOS bulk transistor

49. InAlGaN/GaN HEMTs at Cryogenic Temperatures

50. GaN MEMS resonators : from demonstration to microsystem-compatible performances

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