18 results on '"Lee, Keibock"'
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2. Electrical and Mechanical Characterization of Li Ion Battery Electrode using PinPoint™ SSRM
3. Simultaneous Topographical and Electrochemical Mapping using Scanning Ion Conductance Microscopy – Scanning Electrochemical Microscopy (SICM-SECM)
4. Characterization of Multilayered Ceramic Capacitors via Piezoelectric Force Microscopy
5. Automated AFM for small-scale and large-scale surface profiling in CMP applications
6. Studying post-etching silicon crystal defects on 300mm wafer by automatic defect review AFM
7. Automated Non-Destructive Imaging and Characterization of the Graphene/hBN Moiré Pattern with Non-Contact Mode AFM
8. Automatic defect review for EUV photomask reticles by atomic force microscope
9. High-throughput automatic defect review for 300mm blank wafers with atomic force microscope
10. PIEZORESPONSE FORCE MICROSCOPY: MULTILAYERED CERAMIC CAPACITOR.
11. Automated AFM for small-scale and large-scale surface profiling in CMP applications
12. Topography, Phase Imaging, and Mechanical Property Investigation of Polyester Yarn Interaction with Silicone Gel Matrix.
13. Studying post-etching silicon crystal defects on 300mm wafer by automatic defect review AFM
14. ELECTRICAL CHARACTERIZATION OF SEMICONDUCTOR DEVICE USING SCM AND SKPM IMAGING.
15. Automatic defect review for EUV photomask reticles by atomic force microscope
16. High-throughput automatic defect review for 300mm blank wafers with atomic force microscope
17. Three-dimensional atomic force microscopy.
18. MESSAGE FROM EDITOR.
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