8 results on '"Kuan, H.P."'
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2. The influence of decoupling capacitor on the discharge behavior of fully silcided power-clamped device under HBM ESD event.
3. Influence of hydrogen annealing on NBTI performance.
4. Non-Classical Hot-Electron Gate Current in the Deep Submicrometer N-MOS Flash Memory Cell.
5. Physical analysis of TiSi2 bridging (gate-to-S/D) failure in IC.
6. Successful fault isolation of bit line leakage and leakage suppression by ILD optimization in embedded flash memory.
7. CMOS Gate Oxide Integrity Failure Structure Analysis Using Transmission Electron Microscopy.
8. Physical analysis of TiSi2 bridging (gate-to-S/D) failure in IC
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