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The influence of decoupling capacitor on the discharge behavior of fully silcided power-clamped device under HBM ESD event.
- Source :
- 2010 17th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits (IPFA); 2010, p1-5, 5p
- Publication Year :
- 2010
Details
- Language :
- English
- ISBNs :
- 9781424455966
- Database :
- Complementary Index
- Journal :
- 2010 17th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits (IPFA)
- Publication Type :
- Conference
- Accession number :
- 81643237
- Full Text :
- https://doi.org/10.1109/IPFA.2010.5532248