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Your search keyword '"Joshua W. Pinder"' showing total 4 results

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2. Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters

3. Perspective on improving the quality of surface and material data analysis in the scientific literature with a focus on x-ray photoelectron spectroscopy (XPS)

4. Controlling the Surface Silanol Density in Capillary Columns and Planar Silicon Via the Self-Limiting Gas-Phase Deposition of Tris(Dimethylamino)Methylsilane, and Quantification of Surface Silanols after Silanization by Low Energy Ion Scattering

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