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4. In-situ Plasma Conditioning of InGaAs / High-κ Interface Layers for Defect Density Control Compatible with Scalable FinFET Integration

5. Dual-Lens Electron Holography for Junction Profiling and Strain Mapping of Semiconductor Devices

6. Variable Magnification Electron Holography for 2-D Mapping of Semiconductor Devices

8. Electron energy-loss near-edge structure - a tool for the investigation of electronic structure on the nanometre scale

9. The nitrogen aggregation sequence and the formation of voidites in diamond

10. An EELS study of segregation-induced grain-boundary embrittlement of copper

11. Measurement of the localized electronic structure associated with bismuth segregation to copper grain boundaries

12. Nitrogen determination and characterization in natural diamond platelets

13. Modelling the bonding at metal-ceramic interfaces using PEELS in the STEM

14. Spatially resolved electron energy-loss studies of metal-ceramic interfaces in transition metal/alumina cermets

15. Structural and spectroscopic investigation of (111) twins in barium titanate

16. Investigations of the chemistry and bonding at niobiumsapphire interfaces

17. Recent Attempts to Detect Magnesium in a Heavily Doped Sapphire Bicrystal by Spatially Resolved Electron Energy-Loss Spectroscopy

18. TEM study of the structure and chemistry of a diamond/silicon interface

19. Improvements in detection sensitivity by spatial difference electron energy-loss spectroscopy at interfaces in ceramics

20. HREM and AEM studies of Yb2O3-fluxed silicon nitride ceramics with and without CaO addition

21. Variable magnification dual lens electron holography for semiconductor junction profiling and strain mapping

22. Spatially resolved electron energy-loss near-edge structure analysis of a near Σ = 11 tilt boundary in sapphire

24. Detection of nitrogen at {100} platelets in a type IaA/B diamond

25. Formation of compositionally abrupt axial heterojunctions in silicon-germanium nanowires

26. Characterization of CVD-hydrogenated diamondlike thin films on silicon by EELS, RBS/channeling and nuclear reaction analysis

27. Nanostructure and chemistry of a (100)MgO/(100)GaAs interface

28. Synthesis and characterization of TiO/sub 2/ films for deep trench capacitor applications

29. 'Natural' and 'man-made' platelets in type-la diamonds

30. Analysis of Layered Structures at High Spatial Resolution Using Energy Filtered Imaging

31. Investigations of the Bonding Changes Associated with Grain Boundary Embrittlement

32. Deposition And Characterization Of Silicon And Carbon Nitride

33. Carbon Nitride Films Using a Filtered Cathodic ARC

34. High Resolution Electron Microscopy Studies on Silicon Nitride Ceramics

35. Quantitative Electronic Structure Analysis of α-AL203 Using Spatially Resolved Valence Electron Energy-Loss Spectra

36. Compositions and Thicknesses of Grain Boundary Films in Ca-Doped Silicon Nitride Ceramics

38. Electron energy-loss spectroscopy (EELS) ; comparison with X-ray analysis

39. Nucleation of Special Orientations During Heteroepitaxial Growth of Diamond on Silicon

40. Applications of Multi-Variate Statistical Analysis of Spectrum Images to Microelectronic Devices

41. High-Resolution Electron Microscopy Observations of Grain-Boundary Films in Silicon Nitride Ceramics

42. Energy Dispersive X-Ray (EDX) and Electron Energy-Loss (EELS) Spectroscopic Mapping of Microelectronic Devices

43. Germanium Concentration Profiles Across Interfaces And Close To Dislocations In Cvd Si1−xGex-on-Si Junctions

44. (Under)Graduate Teaching Using Internet Access to Electron Microscopes

45. Application of Nano-Scale Eels Spectrum Lines To Grain Boundaries

46. Identification of Metal-Impurity Gettering Sites in Silicon Formed by Supersaturation Boron Implantation and Annealing Using HRTEM and STEM Micro Analysis

47. STEM investigation of the chemistry and bonding changes associated with the grain boundary embrittlement of Cu by Bi

48. EELS Measurement of the Local Electronic Structure of Copper Atoms Segregated to Aluminum Grain Boundaries

49. Effect of thickness variations on EELS spatial-difference profiles

50. Nitrogen interface engineering in Al[sub 2]O[sub 3] capacitors for improved thermal stability

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