16 results on '"Impurity density"'
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2. 土中水膜厚度变化规律及未冻水含量预测方法.
- Author
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万旭升, 颜梦宇, 路建国, and 晏忠瑞
- Abstract
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- Published
- 2022
- Full Text
- View/download PDF
3. Analysis of Impurity Density in the Structure of Arsenopyrite of the Panimba Deposit
- Author
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Onufrienok, Victor V., Broekmans, Maarten A. T. M., and Dong, Faqin, editor
- Published
- 2015
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4. Effect of impurities in vacuum vessels on the plasma parameters in inductive discharges.
- Author
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Kim, Young-Gi, Yeom, H.J., Kwon, Deuk-Chul, Kim, Kwan-Yong, Chae, Gwang-Seok, Yoon, Jung-Sik, Kim, Jung-Hyung, and Lee, Hyo-Chang
- Subjects
- *
CONTROLLED fusion , *ELECTRON density , *PLASMA density , *PLASMA-wall interactions , *PLASMA stability - Abstract
The mechanisms affecting plasma by external and internal inputs must be understood for both semiconductor processing and controlled nuclear fusion, which require stable and steady-state plasmas. Among various factors that can change the state of plasma, detecting and controlling the plasma–wall interactions inside the reactor are challenging. In particular, although water is a commonly encountered impurity in most vacuum systems including process chambers, studies on the direct evidence of water effect on plasma are limited. Herein, we show that there is a clear negative correlation between the impurity density and the plasma density. A small change in water impurity could cause an immediate change in the plasma density because impurities contribute to increasing the total energy loss in the steady-state plasma sustainment. To observe the impurity effect distinctly, we conducted experiments under various conditions to analyze the effect of vessel impurities on plasma parameters, such as applied power, wall contamination, and wall materials. In the experiments, it is found that the plasma density is significantly influenced by the impurity density. The results were compared with the global model calculation and they are in agreement on the relative change of the electron density. • Influence of impurity on inductively coupled plasma is analyzed. • Introduction of impurities with high rate constants decreases the electron density. • Simulation shows 0.1% H 2 O/Ar flowrate ratio lowers electron density by 74%. • Discharge cleaning effectively reduces impurity content in the vacuum vessel. • Impurity content in the vessel depends on wall material characteristics. [ABSTRACT FROM AUTHOR]
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- 2023
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- View/download PDF
5. Material Operation Limits
- Author
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Naujoks, Dirk
- Published
- 2006
- Full Text
- View/download PDF
6. Reduction of Hydrocarbon Impurities in 200 L/H Helium Liquefier-Refrigerator System
- Author
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Yamada, Shuichi, Mito, Toshiyuki, Nishimura, Arata, Takahata, Kazuya, Satoh, Sadao, Yamamoto, Junya, Yamamura, Hidemasa, Masuda, Kaoru, Kashihara, Shinichirou, Fukusada, Katsuaki, Tada, Eigo, and Kittel, Peter, editor
- Published
- 1994
- Full Text
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7. Density of States of a Two Dimensional Electron Gas in High Magnetic Fields
- Author
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Das Sarma, S., Cardona, Manuel, editor, Fulde, Peter, editor, von Klitzing, Klaus, editor, Queisser, Hans-Joachim, editor, Lotsch, Helmut K. V., editor, and Landwehr, Gottfried, editor
- Published
- 1992
- Full Text
- View/download PDF
8. Evaluation of impurity densities from charge exchange recombination spectroscopy measurements at ASDEX Upgrade
- Author
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Universidad de Sevilla. Departamento de Física Atómica, Molecular y Nuclear, EUROfusion Consortium, McDermott, R. M., Dux, R., Pütterich, T., Geiger, B., Kappatou, A., Lebschy, A., Bruhn, C., Cavedon, M., Frank, A., Harder, N. den, Viezzer, Eleonora, Universidad de Sevilla. Departamento de Física Atómica, Molecular y Nuclear, EUROfusion Consortium, McDermott, R. M., Dux, R., Pütterich, T., Geiger, B., Kappatou, A., Lebschy, A., Bruhn, C., Cavedon, M., Frank, A., Harder, N. den, and Viezzer, Eleonora
- Abstract
At ASDEX upgrade (AUG) a new framework for the evaluation of impurity densities based on measurements from charge exchange recombination spectroscopy (CXRS) diagnostics has been developed. The charge exchange impurity concentration analysis code, or CHICA, can perform these calculations for all of the beam-based CXRS diagnostics at AUG and is equipped with the atomic data for all of the regularly measured charge exchange spectral lines (He, Li, B, C, N, O, and Ne). CHICA includes four different methods for the evaluation of the neutral density populations, which feature different implementations and contain varying levels of sophistication. These methods have been thoroughly benchmarked against one another, enabling the important processes for the evaluation of neutral densities to be identified as well as the neutral populations that are most critical to the accurate interpretation of the measured CXRS intensities. For the AUG neutral beams, charge exchange with the ground state of the first energy component is typically the dominant contribution to the measured CXRS intensities, but emission from reactions with the n = 2 beam halo population can contribute up to 35% to the total signal and must be included in the analysis. Neglect of this population leads to incorrect magnitudes and incorrect profile shapes of the calculated impurity density profiles. The edge lines of sight (LOS) of the core CXRS diagnostics at AUG intersect the edge pedestal inside of the neutral beam volume. Therefore, the impurity density is not constant along the LOS, complicating the interpretation of the measured intensities. Within CHICA a forward model for the edge impurity densities has been implemented, enabling the reconstruction of accurate edge profiles.
- Published
- 2018
9. Evaluation of impurity densities from charge exchange recombination spectroscopy measurements at ASDEX Upgrade
- Author
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Asdex Upgrade Team, T, Mcdermott, R, Dux, R, Putterich, T, Geiger, B, Kappatou, A, Lebschy, A, Bruhn, C, Cavedon, M, Frank, A, Harder, N, Viezzer, E, Asdex Upgrade Team T., McDermott R. M., Dux R., Putterich T., Geiger B., Kappatou A., Lebschy A., Bruhn C., Cavedon M., Frank A., Harder N. D., Viezzer E., Asdex Upgrade Team, T, Mcdermott, R, Dux, R, Putterich, T, Geiger, B, Kappatou, A, Lebschy, A, Bruhn, C, Cavedon, M, Frank, A, Harder, N, Viezzer, E, Asdex Upgrade Team T., McDermott R. M., Dux R., Putterich T., Geiger B., Kappatou A., Lebschy A., Bruhn C., Cavedon M., Frank A., Harder N. D., and Viezzer E.
- Abstract
At ASDEX upgrade (AUG) a new framework for the evaluation of impurity densities based on measurements from charge exchange recombination spectroscopy (CXRS) diagnostics has been developed. The charge exchange impurity concentration analysis code, or CHICA, can perform these calculations for all of the beam-based CXRS diagnostics at AUG and is equipped with the atomic data for all of the regularly measured charge exchange spectral lines (He, Li, B, C, N, O, and Ne). CHICA includes four different methods for the evaluation of the neutral density populations, which feature different implementations and contain varying levels of sophistication. These methods have been thoroughly benchmarked against one another, enabling the important processes for the evaluation of neutral densities to be identified as well as the neutral populations that are most critical to the accurate interpretation of the measured CXRS intensities. For the AUG neutral beams, charge exchange with the ground state of the first energy component is typically the dominant contribution to the measured CXRS intensities, but emission from reactions with the n = 2 beam halo population can contribute up to 35% to the total signal and must be included in the analysis. Neglect of this population leads to incorrect magnitudes and incorrect profile shapes of the calculated impurity density profiles. The edge lines of sight (LOS) of the core CXRS diagnostics at AUG intersect the edge pedestal inside of the neutral beam volume. Therefore, the impurity density is not constant along the LOS, complicating the interpretation of the measured intensities. Within CHICA a forward model for the edge impurity densities has been implemented, enabling the reconstruction of accurate edge profiles.
- Published
- 2018
10. Influence of reactant gas vapor pressure on the electrical properties and the electroluminescent efficiency of GaAsP.
- Author
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Philbrick, J. and Wuestenhoefer, W.
- Abstract
A number of workers have shown that the vapor pressure of the reactant gases strongly influences the electrical properties of GaAs vapor grown in the ASCI system. This paper presents the results of a study of the effects of the variation of vapor pressures on GaAsP grown in the hydride synthesis system. The material was analyzed using Hall effect measurements taken as a function of temperature from room to liquid helium temperatures, and using test electroluminescent diodes. A least squares fit was made to the Hall effect data using a model which includes the effects of two valley conduction to obtain densities of donors and acceptors and donor ionization energies. Increasing reactant gas pressure causes a decrease in donor and acceptor densities as N, N∞ P -2.5 which is slower than the P observed by DiLorenzo in the ASCI system. The ionization energy of the donors was quite high (100 meV) for the high and low pressures, and were less than 10 meV for the intermediate pressures. Hall mobilities at room and liquid nitrogen temperatures were best for material grown at intermediate pressures and the electroluminescent efficiencies of unencapsulated test diodes increased from 0.05 per cent at the extremes to above 0.1-0.2 per cent at the intermediate pressures. These variations are consistent with varying Si incorporation rate and varying density of point defects with varying reactant gas vapor pressure. [ABSTRACT FROM AUTHOR]
- Published
- 1974
- Full Text
- View/download PDF
11. Calculation of impurity density and electron-spin relaxation times in p-type GaAs:Mn.
- Author
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Burobina, Veronika
- Subjects
- *
ELECTRON relaxation time , *MAGNETIC semiconductors , *RELAXATION for health , *MAGNETIC moments , *ELECTRON spin , *AUDITING standards - Abstract
• Electron-spin relaxation times in 3D and 2D p-type GaAs were discussed. • Concentrations of deep and show impurities were calculated for prolonged electron spin relaxation times. • The concentration of shallow donors needs to exceed the concentration of the shallow acceptor. • The maximum spin relaxation times for the 2D and 3D materials are 77 ns and 154 ns, respectively. Magnetic semiconductors have aroused interest due to their various functionalities related to spintronic devices. Manganese (Mn) as a substitutional impurity in A 3 B 5 semiconductors supplies not only holes, but also localized spins. The ejection of Mn atoms with an uncompensated magnetic moment leads to the appearance of ferromagnetic properties. The most suitable material characterized by long-term spin dynamics is n-type GaAs. In p-type GaAs, the spin relaxation time of electrons is generally much shorter. For purposes of this research, electron-spin relaxation times in 3D and 2D p-type GaAs were studied. Calculation of impurity densities and charge state of magnetic acceptors demonstrate the essential composition of the material. Comparison of theoretical and experimental data in optical-spin orientation of electrons reveal the longest spin relaxation time of 77 ns in 2D GaAs:Mn, less than twice the best time in the p-type 3D GaAs material. [ABSTRACT FROM AUTHOR]
- Published
- 2020
- Full Text
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12. Multiple Scattering in Semiconductor Quantum-Wells
- Author
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Lyo, S. K. and Orbach, Raymond L., editor
- Published
- 1987
- Full Text
- View/download PDF
13. Evaluation of impurity densities from charge exchange recombination spectroscopy measurements at ASDEX Upgrade
- Author
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Asdex Upgrade Team T., McDermott R. M., Dux R., Putterich T., Geiger B., Kappatou A., Lebschy A., Bruhn C., Cavedon M., Frank A., Harder N. D., Viezzer E., Universidad de Sevilla. Departamento de Física Atómica, Molecular y Nuclear, EUROfusion Consortium, Asdex Upgrade Team, T, Mcdermott, R, Dux, R, Putterich, T, Geiger, B, Kappatou, A, Lebschy, A, Bruhn, C, Cavedon, M, Frank, A, Harder, N, Viezzer, E, and ASDEX Upgrade Team, Max Planck Institute for Plasma Physics, Max Planck Society
- Subjects
Tokamak ,Population ,impurity density ,01 natural sciences ,Spectral line ,010305 fluids & plasmas ,law.invention ,ASDEX Upgrade ,neutral beam attenuation ,Impurity ,law ,0103 physical sciences ,010306 general physics ,education ,Spectroscopy ,tokamak ,Impurity transport ,Physics ,education.field_of_study ,Neutral beam attenuation ,Impurity density ,Change exchange recombination spectroscopy ,Condensed Matter Physics ,ddc ,impurity transport ,Nuclear Energy and Engineering ,charge exchange recombination spectroscopy ,Atomic physics ,Ground state ,Beam (structure) - Abstract
At ASDEX upgrade (AUG) a new framework for the evaluation of impurity densities based on measurements from charge exchange recombination spectroscopy (CXRS) diagnostics has been developed. The charge exchange impurity concentration analysis code, or CHICA, can perform these calculations for all of the beam-based CXRS diagnostics at AUG and is equipped with the atomic data for all of the regularly measured charge exchange spectral lines (He, Li, B, C, N, O, and Ne). CHICA includes four different methods for the evaluation of the neutral density populations, which feature different implementations and contain varying levels of sophistication. These methods have been thoroughly benchmarked against one another, enabling the important processes for the evaluation of neutral densities to be identified as well as the neutral populations that are most critical to the accurate interpretation of the measured CXRS intensities. For the AUG neutral beams, charge exchange with the ground state of the first energy component is typically the dominant contribution to the measured CXRS intensities, but emission from reactions with the n = 2 beam halo population can contribute up to 35% to the total signal and must be included in the analysis. Neglect of this population leads to incorrect magnitudes and incorrect profile shapes of the calculated impurity density profiles. The edge lines of sight (LOS) of the core CXRS diagnostics at AUG intersect the edge pedestal inside of the neutral beam volume. Therefore, the impurity density is not constant along the LOS, complicating the interpretation of the measured intensities. Within CHICA a forward model for the edge impurity densities has been implemented, enabling the reconstruction of accurate edge profiles. EUROfusion Consortium 633053
- Published
- 2018
14. Electrical properties of poly(ethylene glycol dimethacrylate-n-vinyl imidazole)/single walled carbon nanotubes/n-Si schottky diodes formed by surface polymerization of single walled carbon nanotubes
- Author
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Ali Kara, Hakan Kockar, Nalan Tekin, M. Ahmetoglu, Saadet Kayiran Beyaz, Uludağ Üniversitesi/Fen-Edebiyat Fakültesi/Fizik Bölümü., Uludağ Üniversitesi/Fen-Edebiyat Fakültesi/Kimya Bölümü., Ahmetoğlu, Muhitdin, Kara, Ali, AAG-6271-2019, and Fen Edebiyat Fakültesi
- Subjects
Semiconducting silicon compounds ,Barrier heights ,Electrical measurement ,Schottky diodes ,Leakage currents ,law.invention ,Polymerization ,chemistry.chemical_compound ,Single walled carbon nanotube ,law ,Impurity ,Capacitance voltage characteristic ,Single-walled carbon ,Materials Chemistry ,Imidazole ,Semiconductor diodes ,Electrical measurements ,Physics, condensed matter ,Composite material ,Capacitance voltage measurements ,Physics, applied ,Physics ,Metals and Alloys ,Impurity density ,Surfaces and Interfaces ,Surfaces, Coatings and Films ,Electronic, Optical and Magnetic Materials ,Schottky barriers ,Materials science, multidisciplinary ,Current voltage characteristics ,Schottky Diodes ,Thermionic Emission ,Interface States ,Cvd method ,Materials science, coatings & films ,Current voltage ,Ideality factors ,Silicon ,Materials science ,Schottky barrier ,Surface polymerization ,Capacitance ,Carbon nanotube ,Ethylene ,Ethylene glycol ,Room temperature ,Single-walled carbon nanotubes (swcn) ,Electrical characteristic ,N-vinyl imidazole ,Schottky diode ,Diodes ,Carbon ,Reverse-bias ,chemistry ,Chemical engineering ,Semiconducting silicon ,Bias voltage ,Schottky barrier diodes ,Adsorption ,Metal semiconductor-structure - Abstract
Köçkar, Hakan (Balikesir Author), In this paper we report the electrical characteristics of the Schottky diodes formed by surface polymerization of the Poly(ethylene glycol dimethanylate-n-vinyl imidazole)/Single Walled Carbon Nanotubes on n-Si The Single Walled Carbon Nanotubes were synthesized by CVD method. The main electrical properties of the Poly(ethylene glycol dimethanylate-n-vinyl imidazole)/Single Walled Carbon Nanotubes/n-Si have been investigated through the barrier heights, the ideality factors and the impurity density distribution, by using current-voltage and reverse bias capacitance voltage characteristics. Electrical measurements were carried out at room temperature. Poly(ethylene glycol dimethacrylate-n-vinyl imidazole)/Single Walled Carbon Nanotubes/n-Si Schottky diode current-voltage characteristics display low reverse-bias leakage currents and average barrier heights of 0.61 +/- 0.02 eV and 0.72 +/- 0.02 eV obtained from both current-voltage and capacitance-voltage measurements at room temperature, respectively.
- Published
- 2012
15. Poloidal asymmetries due to ion cyclotron resonance heating
- Author
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Kazakov, Ye O., Pusztai, I., Fülöp, T., Johnson, Thomas, Kazakov, Ye O., Pusztai, I., Fülöp, T., and Johnson, Thomas
- Abstract
The poloidal density asymmetry of impurity ions in ion cyclotron resonance heated (ICRH) discharges is calculated. The link between the asymmetry strength and ICRH and plasma parameters is quantified. The main parameter governing the asymmetry strength is identified to be the minority ion temperature anisotropy. Through numerical simulations with the full-wave TORIC code coupled to the Fokker-Planck quasilinear solver SSFPQL, the dependence of the anisotropy on various parameters, such as ICRH power, background density and temperature, minority and impurity concentration and toroidal wavenumber has been investigated. An approximate expression for the poloidal asymmetry of impurities as a function of plasma parameters, resonance location and ICRH power is given. A quantification of the link of the impurity asymmetry and ICRH heating is valuable not only for understanding the changes in the cross-field transport but also for the possibilities to use the asymmetry measurements as diagnostics., QC 20121029
- Published
- 2012
- Full Text
- View/download PDF
16. Simulation de la cinétique des transitions électroniques entre les niveaux énergétiques d'un semiconducteur doté d'impuretés
- Author
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G. Kamarinos, J. Brini, and P. Viktorovitch
- Subjects
010302 applied physics ,Physics ,impurity electron states and effects ,free electrons ,free holes ,chemical kinetic reaction equations ,semiconductors ,02 engineering and technology ,021001 nanoscience & nanotechnology ,impurity density ,multiple impurity behaviour ,01 natural sciences ,electronic transitions ,kinetics simulation ,trapping properties ,Shockley Read equations ,[PHYS.HIST]Physics [physics]/Physics archives ,0103 physical sciences ,photoconductivity ,carrier capture probability ,energy levels ,impurity doped semiconductor ,0210 nano-technology ,Humanities - Abstract
Nous simulons la cinétique des interactions entre électrons libres, trous libres et impuretés dans un semiconducteur dont l'état stationnaire peut être hors de l'équilibre thermodynamique. L'identité formelle des équations de Shockley-Read avec des équations de cinétique chimique nous permet d'utiliser un calculateur original destiné à simuler des réseaux de réactions chimiques (en neurobiologie par exemple). Nous obtenons la confirmation en régime dynamique de résultats, déduits d'expériences de photoconductivité, concernant les propriétés de piégeage des niveaux d'impuretés. La simulation nous conduit à dégager une méthode permettant de déterminer les caractéristiques des impuretés (niveau énergétique, densité, coefficients d'émission et de captation des électrons et des trous). Nous mettons également en évidence la possibilité de prévoir le comportement de milieux dotés de plusieurs niveaux d'impuretés.
- Published
- 1974
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