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1. Automated orientation analysis of back-reflection X-ray Laue patterns. A system for indexing Laue spots and outputting stereographic projections by microcomputer

Author

Sei Miura, Satoshi Hashimoto, and Osamu Itoh

Subjects
Materials science, business.industry, Mechanical Engineering, Computation, Stereographic projection, Condensed Matter Physics, Reflection (mathematics), Optics, Projection (mathematics), Mechanics of Materials, Microcomputer, Plotter, General Materials Science, Greninger chart, business, Rotation (mathematics)
Abstract

A new automatic system to analyze the orientations of the crystallographic axes of arbitrarily oriented cubic crystals using the back-reflection X-ray Laue method has been developed. The system consists of a tablet digitizer to input the coordinates of Laue spots, an usual microcomputer to index Laue patterns and a plotter to output stereographic projection.The accuracy of the analysis was remarkably improved in comparison with the traditional method of indexing with Greninger chart and Wulff net; it is estimated to be less than 0.1-0.2° in consequence of optimizing the rotation of standard projection and compensating the distance between specimen and film by computation. The time required is about ten minutes.

Published
1985

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