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1. Magnetic X-ray imaging using a single polarization and multimodal-ptychography

2. Patching-based Deep Learning model for the Inpainting of Bragg Coherent Diffraction patterns affected by detectors' gaps

3. Soft X-ray spectro-ptychography on boron nitride nanotubes, carbon nanotubes and permalloy nanorods

4. darfix: Data analysis for dark-field X-ray microscopy

5. PyNX: high performance computing toolkit for coherent X-ray imaging based on operators

6. Boosting spatial resolution by incorporating periodic boundary conditions into single-distance hard-x-ray phase retrieval

7. Free log-likelihood as an unbiased metric for coherent diffraction imaging

8. Ptychography at the carbon K-edge

9. Large and uniform optical emission shifts in quantum dots externally strained along their growth axis

10. EBS status of the large-volume press at beamline ID06-LVP.

11. Time-dependent relaxation of strained silicon-on-insulator lines using a partially coherent x-ray nanobeam

12. Interface-driven phase separation in multifunctional materials: the case of GeMn ferromagnetic semiconductor

13. Fast computing of scattering maps of nanostructures using graphical processing units

15. Author Correction: Continuous scanning for Bragg coherent X-ray imaging

16. Continuous scanning for Bragg coherent X-ray imaging

18. Booklet of presentations from the PaNOSC Closing Event, 29-30 November 2022

21. Coherent X-ray imaging on ID16A: status and plans

22. Coherent diffraction imaging at space-group forbidden reflections

24. The Nanodiffraction beamline ID01/ESRF: A microscope for imaging strain and structure

25. Workshop report 'Training in the EOSC'

27. Contributors

29. Resonant diffraction

32. Mapping Inversion Domain Boundaries along Single GaN Wires with Bragg Coherent X-ray Imaging

33. A Study on the Strain Distribution by Scanning X-ray diffraction on GaP/Si for III-V Monolithic Integration on Silicon for Nonlinear Optics

34. Workshop report 'Training in the EOSC'

36. Nano Beam X-ray Scattering on GaP/Si for III-V Monolithic Integration on Silicon

37. A study of the strain distribution by scanning X-ray diffraction on GaP/Si for III–V monolithic integration on silicon

39. Crystallographic orientation of facets and planar defects in functional nanostructures elucidated by nano-focused coherent diffractive X-ray imaging

40. Determination of the cationic distribution in oxidic thin films by resonant X-ray diffraction: the magnetoelectric compound Ga2-xFexO3. Supporting information

41. Crystallographic orientation of facets and planar defects in functional nanostructures elucidated by nano-focused coherent diffractive X-ray imaging

43. Nondestructive Method for the Determination of the Electric Polarization Orientation in Thin Films: Illustration on Gallium Ferrite Thin Films

45. XTOP: high-resolution X-ray diffraction and imaging

46. FOX: A friendly tool to solve nonmolecular structures from powder diffraction

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