276 results on '"Erlbacher, Tobias"'
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2. Impact of the transition region between active area and edge termination on electrical performance of SiC MOSFET
3. Very High In‐Plane Magnetic Field Sensitivity in Ion‐Implanted 4H‐SiC PIN Diodes
4. Technological Advances Towards 4H-SiC JBS Diodes for Wind Power Applications
5. Very High Temperature Hall Sensors in a Wafer‐Scale 4H‐SiC Technology.
6. Wavelength-selective 4H-SiC UV-sensor array
7. Evidence of low injection efficiency for implanted p-emitters in bipolar 4H-SiC high-voltage diodes
8. The GaN trench gate MOSFET with floating islands: High breakdown voltage and improved BFOM
9. Improved Properties of Post-Deposition Annealed Ga2O3/SiC and Ga2O3/Al2O3/SiC Back-Gate Transistors Fabricated by Radio Frequency Sputtering
10. The impact of dislocations on AlGaN/GaN Schottky diodes and on gate failure of high electron mobility transistors
11. Lateral Power Transistors Combining Planar and Trench Gate Topologies
12. Lateral Power Transistors on Wide Bandgap Semiconductors
13. Lateral Power Transistors with Trench Patterns
14. Modern MOS-Based Power Device Technologies in Integrated Circuits
15. Lateral Power Transistors with Charge Compensation Patterns
16. Introduction
17. Power Electronic and RF Amplifier Circuits
18. Power Semiconductor Devices in Power Electronic Applications
19. Demand for Power Electronic Systems and Radio-Frequency Applications
20. Summary of Integration Concepts for LDMOS Transistors
21. Time-Dependent Dielectric Breakdown of 4H-SiC MOSFETs in CMOS Technology
22. A Highly Linear Temperature Sensor Operating up to 600°C in a 4H-SiC CMOS Technology
23. Monolithic 3D TSV-based high-voltage, high-temperature capacitors
24. A Highly Linear Temperature Sensor Operating up to 600°C in a 4H-SiC CMOS Technology
25. Microfabricated albedo insensitive sun position sensor system in silicon carbide with integrated 3D optics and CMOS electronics
26. Improved Properties of Post-Deposition Annealed Ga 2 O 3 /SiC and Ga 2 O 3 /Al 2 O 3 /SiC Back-Gate Transistors Fabricated by Radio Frequency Sputtering.
27. The Influence of Extended Defects in 4H-SiC Epitaxial Layers on Gate Oxide Performance and Reliability
28. Towards Sic-Based VUV Pin-Photodiodes - Investigations on 4H-SiC Photodiodes with Shallow Implanted Al Emitters
29. Threshold Voltage Adjustment on 4H-SiC MOSFETs Using P-Doped Polysilicon as a Gate Material
30. Highly Efficient Floating Field Rings for SiC Power Electronic Devices - A Systematic Experimental Study
31. A Modeling of 4H-SiC Super-Junction MOSFETs with Filtered High Energy Implantation
32. Microfabricated albedo insensitive sun position sensor system in silicon carbide with integrated 3D optics and CMOS electronics
33. Future technology trends
34. List of contributors
35. Adjustable Current Limit Feature with a Self-Sensing and Self-Triggering Monolithically Integrated SiC Circuit Breaker Device
36. Integrated Digital and Analog Circuit Blocks in a Scalable Silicon Carbide CMOS Technology
37. Visible Blind Quadrant Sun Position Sensor in a Silicon Carbide Technology
38. Adjustable Current Limiting Function With a Monolithically Integrated SiC Circuit Breaker Device
39. Fabrication Aspects and Switching Performance of a Self-Sensing 800 V SiC Circuit Breaker Device
40. Visible Blind Quadrant Sun Position Sensor in a Silicon Carbide Technology
41. Integrated Digital and Analog Circuit Blocks in a Scalable Silicon Carbide CMOS Technology
42. Mechanisms of Ohmic Contact Formation of Ti/Al-Based Metal Stacks on p-Doped 4H‑SiC
43. Correlation of Extended Defects with Electrical Yield of SiC MOSFET Devices
44. Proven Power Cycling Reliability of Ohmic Annealing Free SiC Power Device through the Use of SmartSiCTM Substrate
45. Study on Estimation of Device Yield in Non-Epitaxial 4H-SiC Material Relating to Defect Densities Influencing Bipolar Degradation with XRT- Measurements
46. Resistive and CTAT Temperature Sensors in a Silicon Carbide CMOS Technology
47. Reliability of Silicon-Nitride based High-Voltage Monolithic Capacitors
48. Monolithisch integrierter Lasttrennschalter in SiC JFET Technologie
49. Process-based Modeling of 4H-SiC Double-trench MOSFETs with Reshaped Trench Geometries
50. SiC Power MOS technology evolution. Sustainable and efficient energy conversion in DC grids
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