265 results on '"En Xia Zhang"'
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2. Single-Event Burnout by Cf-252 Irradiation in Vertical $\beta$-Ga2O3 Diodes with Pt and PtOx Schottky Contacts and High Permittivity Dielectric Field Plate.
3. Effects of Charge Generation and Trapping on the X-ray Response of Strained AlGaN/GaN HEMTs.
4. Low-Frequency and Random Telegraph Noise in 14-nm Bulk Si Charge-Trap Transistors
5. Angle Dependence of Focused X-Ray-Induced Single Event Transients in an Epitaxial Silicon Diode
6. Impact of Heavy-Ion Range on Single-Event Effects in Silicon Carbide Power Junction Barrier Schottky Diodes
7. Low-Frequency Noise and Border Traps in Irradiated nMOS and pMOS Bulk Si FinFETs With SiO2/HfO2 Gate Dielectrics
8. Total-Ionizing-Dose Effects and Low-Frequency Noise in N-Type Carbon Nanotube Field-Effect Transistors With HfO₂ Gate Dielectrics
9. Effects of Geometry and Cycling on the Radiation Response of Charge-Trapping NAND Memory Devices With SiON Tunneling Oxide
10. Total-Ionizing-Dose Effects on 3-D Sequentially Integrated FDSOI Ring Oscillators
11. Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs
12. Angle Dependence of Focused X-Ray-Induced Single Event Transients
13. Comparison of Single-Event Transients in an Epitaxial Silicon Diode Resulting from Heavy Ion-, Focused X-Ray-, and Pulsed Laser-Induced Charge Generation
14. Comparison of Single-Event Transients in an Epitaxial Silicon Diode Resulting from Heavy Ion-, Focused X-Ray-, and Pulsed Laser-Induced Charge Generation
15. Radiation Effects in AlGaN/GaN HEMTs
16. Total-Ionizing-Dose Response of SiGe HBTs at Elevated Temperatures
17. Response of Integrated Silicon Microwave pin Diodes to X-Ray and Fast-Neutron Irradiation
18. Negative-Bias-Stress and Total-Ionizing-Dose Effects in Deeply Scaled Ge-GAA Nanowire pFETs
19. Total-Ionizing-Dose Effects on Polycrystalline-Si Channel Vertical-Charge-Trapping Nand Devices
20. Aging Effects and Latent Interface-Trap Buildup in MOS Transistors
21. Supply Voltage Dependence of Ring Oscillator Frequencies for Total Ionizing Dose Exposures for 7-nm Bulk FinFET Technology
22. Proton radiation effects on optically transduced silicon carbide microdisk resonators
23. Total-ionizing-dose effects and reliability of carbon nanotube FET devices.
24. A System-Level Modeling Approach for Simulating Radiation Effects in Successive-Approximation Analog-to-Digital Converters
25. Variability in Total-Ionizing-Dose Response of Fourth-Generation SiGe HBTs
26. Impacts of Through-Silicon Vias on Total-Ionizing-Dose Effects and Low-Frequency Noise in FinFETs
27. Total Ionizing Dose Responses of 22-nm FDSOI and 14-nm Bulk FinFET Charge-Trap Transistors
28. 3-D Full-Band Monte Carlo Simulation of Hot-Electron Energy Distributions in Gate-All-Around Si Nanowire MOSFETs
29. Comparison of Single-Event Transients in an Epitaxial Silicon Diode Resulting From Heavy-Ion-, Focused X-Ray-, and Pulsed Laser-Induced Charge Generation
30. Single-Event-Induced Charge Collection in Ge-Channel pMOS FinFETs
31. Single-Event Transient Response of Vertical and Lateral Waveguide-Integrated Germanium Photodiodes
32. High fluence 1.8 MeV proton irradiation effects on n-type MOS capacitors.
33. 1/f Noise in GaN HEMTs grown under Ga-rich, N-rich, and NH3-rich conditions.
34. Sensitive-Volume Model of Single-Event Latchup for a 180-nm SRAM Test Structure
35. Total-Ionizing-Dose Effects in InGaAs MOSFETs With High-k Gate Dielectrics and InP Substrates
36. Worst-Case Bias for High Voltage, Elevated-Temperature Stress of AlGaN/GaN HEMTs
37. Total-Ionizing-Dose Effects on 3D Sequentially Integrated, Fully Depleted Silicon-on-Insulator MOSFETs
38. Charge Transport in Vertical GaN Schottky Barrier Diodes: A Refined Physical Model for Conductive Dislocations
39. Total-Ionizing-Dose Effects and Low-Frequency Noise in 30-nm Gate-Length Bulk and SOI FinFETs With SiO2/HfO2Gate Dielectrics
40. Comparison of Sensitive Volumes Associated With Ion- and Laser-Induced Charge Collection in an Epitaxial Silicon Diode
41. The Impact of Proton-Induced Single Events on Image Classification in a Neuromorphic Computing Architecture
42. Polarization Dependence of Pulsed Laser-Induced SEEs in SOI FinFETs
43. Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors
44. Total-Ionizing-Dose Effects at Ultra-High Doses in AlGaN/GaN HEMTs
45. Practical considerations in the design of SRAM cells on SOI.
46. Radiation Effects and Low-Frequency Noise in AlGaN/GaN HEMTs
47. Low-frequency 1/f noise in a graphene/silicon X-ray detector
48. Proton irradiation-induced traps causing VT instabilities and RF degradation in GaN HEMTs.
49. Gate Bias and Length Dependences of Total Ionizing Dose Effects in InGaAs FinFETs on Bulk Si
50. Empirical Modeling of FinFET SEU Cross Sections Across Supply Voltage
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