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1. Redundancy Parameterization and Inverse Kinematics of 7-DOF Revolute Manipulators

2. A Systematic Methodology for Modeling and Attitude Control of Multi-body Space Telescopes

4. Current AI Technology in Space

5. Report on ZBook Barrel Connector

7. Characterizing the Structure of Lithium Metal Batteries using Local Ultrasonic Resonance Spectroscopy (LURS)

8. Characterizing the Structure of Lithium Metal Batteries using Local Ultrasonic Resonance Spectroscopy (LURS)

9. Enterprise Digital Transformation

11. Optimizing Channelization for Fun and Profit

12. Toward Accurate Thermal Modeling of Phase Change Material Based Photonic Devices

13. Final Technical Report: NASA Wireless Smart Plug

15. Single Event Effect Testing of the SSDI SFF6661 N-Channel Power MOSFET

16. An Accelerated Life Testing Dataset for Lithium-Ion Batteries With Constant and Variable Loading Conditions

17. NASA Engineering and Safety Center Technical Bulletin No. 23-07: Best Practices for Fabrication of Microelectronic Devices

19. An Examination of Heavy Ion-Induced Persistent Visual Error Signatures in an Electronic Display Driver Integrated Circuit

21. Flex-Capsule for the Roman Space Telescope High Gain Antenna Gimbal

23. Venus Surface Environmental Chamber Test of SiC JFET-R Multi-Chip Circuit Board

24. Metal Contact Processing Experiments Towards Realizing 500 °C Durable RF 4H-SiC BJTs

26. JC-13 Fluorocarbon Tech Discussion

27. Single-Event Effects Test Report Linux Operating System Configurations on TUL PYNQ-Z2

29. Development of Two High-Energy Bus ‘Cores’ for Rapid Support of Low-TRL and Educational Payloads: A Software-Configured EPS Combined with Flexible C&DH

30. Single-Event Effects Response of 96- and 176-Layer 3D NAND Flash Memories

31. An Examination of the Radiation Sensitivity of Electronic Display Pixel Technologies

32. Under-Constrained SEE Data: Implications for Estimating and Bounding SEE Rates

33. Single-Event Effects Response of 96- and 176-Layer 3D NAND Flash Memories

35. Computer Human Interface Challenges in Space Exploration

38. Comparing the Electrical Modeling and Thermal Analysis Toolbox Simulation Data to Electrified Aircraft Propulsion Test Hardware Data

40. Processing Choices for Achieving Long Term IC Operation at 500° C

41. C30665L CD3740 Displacement Damage and Total Ionizing Dose Test Report

42. SMD Technology Highlights

49. Extended Temperature Operation of Isolated, Precision Gate Driver, ADuM4120

50. Texas Instrument DRV8881 2.5A Dual H-Bridge Motor Driver Heavy-Ion Single-Event Effects Test Report

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