1. Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality
- Author
-
Frank Poehl, Ron Press, Xijiang Lin, Olivier Barondeau, Martin Kaibel, Matthias Beck, Infineon Technologies AG [München], Mentor Graphics Corporation, Wilsonville, Mentor Graphics Corporation, Wilsonville OR, Mentor Graphics Corporation, and EDAA - European design and Automation Association
- Subjects
[INFO.INFO-AR]Computer Science [cs]/Hardware Architecture [cs.AR] ,FOS: Computer and information sciences ,MicroBlaze ,business.industry ,Computer science ,Design for testing ,020208 electrical & electronic engineering ,Test compression ,02 engineering and technology ,Digital clock manager ,Automatic test pattern generation ,020202 computer hardware & architecture ,[SPI.TRON]Engineering Sciences [physics]/Electronics ,Logic synthesis ,Test vector ,Hardware Architecture (cs.AR) ,0202 electrical engineering, electronic engineering, information engineering ,Electronic engineering ,System on a chip ,business ,Field-programmable gate array ,Computer Science - Hardware Architecture ,Computer hardware ,Asynchronous circuit - Abstract
This paper addresses delay test for SOC devices with high frequency clock domains. A logic design for on-chip high-speed clock generation, implemented to avoid expensive test equipment, is described in detail. Techniques for on-chip clock generation, meant to reduce test vector count and to increase test quality, are discussed. ATPG results for the proposed techniques are given., Submitted on behalf of EDAA (http://www.edaa.com/)
- Published
- 2007