Mutation Sampling Technique for the Generation of Structural Test Data

Authors :: Bruno Rouzeyre
M. Scholive
Marie-Lise Flottes
Chantal Robach
Vincent Beroulle
Beroulle, Vincent
Laboratoire de Conception et d'Intégration des Systèmes (LCIS)
Institut Polytechnique de Grenoble - Grenoble Institute of Technology-Université Pierre Mendès France - Grenoble 2 (UPMF)
Conception et Test de Systèmes MICroélectroniques (SysMIC)
Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM)
Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)
EDAA - European design and Automation Association
LCIS LIRMM
Source :: DATE: Design, Automation and Test in Europe, DATE: Design, Automation and Test in Europe, Mar 2005, Munich, Germany. pp.1022-1023, DATE: Design, Automation and Test in Europe, 2005, Munich, Germany. pp.1022, LATW'05, 6th IEEE Latin American Test Workshop, 6th IEEE Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil, DATE
Publication Year :: 2007
Publisher :: arXiv, 2007.
Abstract: Our goal is to produce validation data that can be used as an efficient (pre) test set for structural stuck-at faults. In this paper, we detail an original test-oriented mutation sampling technique used for generating such data and we present a first evaluation on these validation data with regard to a structural test.<br />Comment: Submitted on behalf of EDAA (http://www.edaa.com/)

Subjects :: [INFO.INFO-AR]Computer Science [cs]/Hardware Architecture [cs.AR]
FOS: Computer and information sciences
sampling
Integration testing
Computer science
[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
Other Computer Science (cs.OH)
Manual testing
02 engineering and technology
Automatic test pattern generation
computer.software_genre
high-level test
Keyword-driven testing
Computer Science - Other Computer Science
0202 electrical engineering, electronic engineering, information engineering
Test Management Approach
[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
functional verification
Model-based testing
Functional verification
Sampling (statistics)
020207 software engineering
020202 computer hardware & architecture
Reliability engineering
[SPI.TRON]Engineering Sciences [physics]/Electronics
Test set
Non-regression testing
Mutation (genetic algorithm)
Fault coverage
Data mining
mutation
computer
Test data

Database :: OpenAIRE
Journal :: DATE: Design, Automation and Test in Europe, DATE: Design, Automation and Test in Europe, Mar 2005, Munich, Germany. pp.1022-1023, DATE: Design, Automation and Test in Europe, 2005, Munich, Germany. pp.1022, LATW'05, 6th IEEE Latin American Test Workshop, 6th IEEE Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil, DATE
Accession number :: edsair.doi.dedup.....2f041d9f7f2844d4df2980c1705268ba
Full Text :: https://doi.org/10.48550/arxiv.0710.4802