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This Letter proposes a low-cost, single event double-upset tolerant latch which utilises interlocked nodes to keep data, clock gating (CG) in Muller C-element (MCE) to turn off the storage cell, a three-input MCE to block the soft error from the storage cell and a weak keeper to prevent high impedance state. The storage cell in the proposed latch has better reliability than the conventional triple path dual-interlocked storage cell (TPDICE). Most up-to-date single event double-upset (SEDU) tolerant latches are carried out with too large cost penalties. The proposed one saves up to 93.32% area-power-delay product (APDP) compared with one up-to-date SEDU tolerant latch and even saves 36.36% APDP compared with only single event upset (SEU) tolerant latch in the referential. Simulation results have verified SEU and SEDU tolerance of the proposed latch.

This paper presents a novel highly reliable dual port 12T static random access memory (SRAM) bitcell. Compared with the state-of-the-art soft-error-tolerant bitcells and the traditional 6T, the proposed 12T exhibits much larger read noise margin (RSNM), and also saves 85.4% read access time on average, making it much suitable for high-speed highly reliable applications.