44 results on '"Cho, Wen-Hao"'
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2. Atomic layer deposition of vanadium oxides using vanadyl acetylacetonate as the precursor
3. CF4 plasma-based atomic layer etching of Al2O3 and surface smoothing effect
4. Conductive and transparent multilayer films for low-temperature TiO2/Ag/SiO2 electrodes by E-beam evaporation with IAD
5. CF4 plasma-based atomic layer etching of Al2O3 and surface smoothing effect.
6. Study of a sandwich structure of transparent conducting oxide films prepared by electron beam evaporation at room temperature
7. Residual stress in obliquely deposited Mg[F.sub.2] thin films
8. Admittance analysis of broadband omnidirectional near-perfect absorber in epsilon-near-zero mode
9. An electric measuring equipment integrated with an automatic optical registration and a chamber-based gas supply system for wafer-based gas sensors
10. The Fabrication of a UV Notch Filter by Using Solid State Diffusion
11. Transmittance uncertainty evaluation for a broadband spectrophotometer system
12. An electric measuring equipment integrated with an automatic optical registration and a chamber-based gas supply system for wafer-based gas sensors
13. Preparation of Aluminum Oxide-Coated Glass Slides for Glycan Microarrays
14. Platinum growth analysis in atomic layer deposition using in-situ resistance measurement
15. The enhancement of refractive index contrast using solid state diffusion mechanism
16. Investigation of the Microstructure, Porosity, Adhesion, and Optical Properties of a WO3 Film Fabricated Using an E-Beam System With Ion Beam-Assisted Deposition
17. Investigation on optical and electrical properties of ZnO sandwich structure with metal interlayer
18. Controllable photonic mirror fabricated by the atomic layer deposition on the nanosphere template
19. Fabrication of highly ordered nanohoneycomb (ZnO/Pt) arrays
20. Low-refractive-index oxide thin films originated from the Kirkendall effect
21. Head-up display using an inclined Al2O3 column array
22. A Novel Head-Up Display Using Inclined Al2O3 Column Array
23. Low-Refractive-Index Optical Thin Films Originated From Kirkendall Effect
24. Atomic layer deposition of aluminum-doped zinc oxide films for the light harvesting enhancement of a nanostructured silicon solar cell
25. Novel structure of controllable of photonic mirror fabricated by atomic layer deposition on nanosphere template
26. Broadband microspectrophotometer with tablet PC control
27. Effects of DC Bias on the Microstructure, Residual Stress and Hardness Properties of TiVCrZrTaN Films by Reactive RF Magnetron Sputtering
28. Wide-angle antireflection ZnO films on bullet-like nanostructures of multi-crystalline silicon
29. The research of relationships between residual stress and columnar angles in oblique deposition of magnesium fluoride thin films
30. Fabrication of double nanohoneycombs (Al/SiO2) with controllable size using nanosphere lithography
31. Photocatalysis of Ag-Loaded TiO2 Nanotube Arrays Formed by Atomic Layer Deposition
32. Microstructure and optical properties of Al_2O_3 prepared by oblique deposition using microsphere shell templates
33. The optical measurement on the CVD silica film deposited on a fused quartz substrate
34. Microstructure and Optical Properties of Al2O3 Prepared by Oblique Deposition Using Nanosphere Shell as Templates
35. The effect of aerospace environment on band-pass filters fabricated by Ion-assisted deposition process
36. Fabrication and characterization of n-ZnO on glass by IAD at low temperature
37. The research of oblique deposition of lanthanum fluoride thin films at 193nm
38. Residual Stress of Obliquely Deposited MgF^2 Thin Films
39. The research of oblique deposition of lanthanum fluoride thin films at 193nm.
40. Head-up display using an inclined Al_2O_3 column array
41. Low-refractive-index oxide thin films originated from the Kirkendall effect
42. The research of relationships between residual stress and columnar angles in oblique deposition of magnesium fluoride thin films
43. Photocatalysis of Ag-Loaded TiO2Nanotube Arrays Formed by Atomic Layer Deposition
44. An electric measuring equipment integrated with an automatic optical registration and a chamber-based gas supply system for wafer-based gas sensors.
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