1. Measurement of the phase between strong and electromagnetic amplitudes of J/ψ decays
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M. Ablikim, M.N. Achasov, S. Ahmed, M. Albrecht, A. Amoroso, F.F. An, Q. An, Y. Bai, O. Bakina, R. Baldini Ferroli, Y. Ban, D.W. Bennett, J.V. Bennett, N. Berger, M. Bertani, D. Bettoni, J.M. Bian, F. Bianchi, E. Boger, I. Boyko, R.A. Briere, H. Cai, X. Cai, O. Cakir, A. Calcaterra, G.F. Cao, S.A. Cetin, J. Chai, J.F. Chang, G. Chelkov, G. Chen, H.S. Chen, J.C. Chen, M.L. Chen, P.L. Chen, S.J. Chen, X.R. Chen, Y.B. Chen, X.K. Chu, G. Cibinetto, H.L. Dai, J.P. Dai, A. Dbeyssi, D. Dedovich, Z.Y. Deng, A. Denig, I. Denysenko, M. Destefanis, F. De Mori, Y. Ding, C. Dong, J. Dong, L.Y. Dong, M.Y. Dong, Z.L. Dou, S.X. Du, P.F. Duan, J. Fang, S.S. Fang, X. Fang, Y. Fang, R. Farinelli, L. Fava, S. Fegan, F. Feldbauer, G. Felici, C.Q. Feng, E. Fioravanti, M. Fritsch, C.D. Fu, Q. Gao, X.L. Gao, Y. Gao, Y.G. Gao, Z. Gao, I. Garzia, K. Goetzen, L. Gong, W.X. Gong, W. Gradl, M. Greco, M.H. Gu, S. Gu, Y.T. Gu, A.Q. Guo, L.B. Guo, R.P. Guo, Y.P. Guo, Z. Haddadi, S. Han, X.Q. Hao, F.A. Harris, K.L. He, F.H. Heinsius, T. Held, Y.K. Heng, T. Holtmann, Z.L. Hou, C. Hu, H.M. Hu, T. Hu, Y. Hu, G.S. Huang, J.S. Huang, X.T. Huang, X.Z. Huang, Z.L. Huang, T. Hussain, W. Ikegami Andersson, Q. Ji, Q.P. Ji, X.B. Ji, X.L. Ji, X.S. Jiang, X.Y. Jiang, J.B. Jiao, Z. Jiao, D.P. Jin, S. Jin, Y. Jin, T. Johansson, A. Julin, N. Kalantar-Nayestanaki, X.L. Kang, X.S. Kang, M. Kavatsyuk, B.C. Ke, T. Khan, A. Khoukaz, P. Kiese, R. Kliemt, L. Koch, O.B. Kolcu, B. Kopf, M. Kornicer, M. Kuemmel, M. Kuessner, M. Kuhlmann, A. Kupsc, W. Kühn, J.S. Lange, M. Lara, P. Larin, L. Lavezzi, S. Leiber, H. Leithoff, C. Leng, C. Li, Cheng Li, D.M. Li, F. Li, F.Y. Li, G. Li, H.B. Li, H.J. Li, J.C. Li, K.J. Li, Kang Li, Ke Li, Lei Li, P.L. Li, P.R. Li, Q.Y. Li, T. Li, W.D. Li, W.G. Li, X.L. Li, X.N. Li, X.Q. Li, Z.B. Li, H. Liang, Y.F. Liang, Y.T. Liang, G.R. Liao, D.X. Lin, B. Liu, B.J. Liu, C.X. Liu, D. Liu, F.H. Liu, Fang Liu, Feng Liu, H.B. Liu, H.M. Liu, Huanhuan Liu, Huihui Liu, J.B. Liu, J.P. Liu, J.Y. Liu, K. Liu, K.Y. Liu, Ke Liu, L.D. Liu, P.L. Liu, Q. Liu, S.B. Liu, X. Liu, Y.B. Liu, Z.A. Liu, Zhiqing Liu, Y.F. Long, X.C. Lou, H.J. Lu, J.G. Lu, Y. Lu, Y.P. Lu, C.L. Luo, M.X. Luo, X.L. Luo, X.R. Lyu, F.C. Ma, H.L. Ma, L.L. Ma, M.M. Ma, Q.M. Ma, T. Ma, X.N. Ma, X.Y. Ma, Y.M. Ma, F.E. Maas, M. Maggiora, Q.A. Malik, Y.J. Mao, Z.P. Mao, S. Marcello, Z.X. Meng, J.G. Messchendorp, G. Mezzadri, J. Min, T.J. Min, R.E. Mitchell, X.H. Mo, Y.J. Mo, C. Morales Morales, G. Morello, N.Yu. Muchnoi, H. Muramatsu, A. Mustafa, Y. Nefedov, F. Nerling, I.B. Nikolaev, Z. Ning, S. Nisar, S.L. Niu, X.Y. Niu, S.L. Olsen, Q. Ouyang, S. Pacetti, Y. Pan, M. Papenbrock, P. Patteri, M. Pelizaeus, J. Pellegrino, H.P. Peng, K. Peters, J. Pettersson, J.L. Ping, R.G. Ping, A. Pitka, R. Poling, V. Prasad, H.R. Qi, M. Qi, S. Qian, C.F. Qiao, N. Qin, X.S. Qin, Z.H. Qin, J.F. Qiu, K.H. Rashid, C.F. Redmer, M. Richter, M. Ripka, M. Rolo, G. Rong, Ch. Rosner, X.D. Ruan, A. Sarantsev, M. Savrié, C. Schnier, K. Schoenning, W. Shan, M. Shao, C.P. Shen, P.X. Shen, X.Y. Shen, H.Y. Sheng, J.J. Song, W.M. Song, X.Y. Song, S. Sosio, C. Sowa, S. Spataro, G.X. Sun, J.F. Sun, L. Sun, S.S. Sun, X.H. Sun, Y.J. Sun, Y.K. Sun, Y.Z. Sun, Z.J. Sun, Z.T. Sun, C.J. Tang, G.Y. Tang, X. Tang, I. Tapan, M. Tiemens, B. Tsednee, I. Uman, G.S. Varner, B. Wang, B.L. Wang, D. Wang, D.Y. Wang, Dan Wang, K. Wang, L.L. Wang, L.S. Wang, M. Wang, Meng Wang, P. Wang, P.L. Wang, W.P. Wang, X.F. Wang, Y. Wang, Y.D. Wang, Y.F. Wang, Y.Q. Wang, Z. Wang, Z.G. Wang, Z.H. Wang, Z.Y. Wang, Zongyuan Wang, T. Weber, D.H. Wei, P. Weidenkaff, S.P. Wen, U. Wiedner, M. Wolke, L.H. Wu, L.J. Wu, Z. Wu, L. Xia, X. Xia, Y. Xia, D. Xiao, H. Xiao, Y.J. Xiao, Z.J. Xiao, Y.G. Xie, Y.H. Xie, X.A. Xiong, Q.L. Xiu, G.F. Xu, J.J. Xu, L. Xu, Q.J. Xu, Q.N. Xu, X.P. Xu, L. Yan, W.B. Yan, W.C. Yan, Y.H. Yan, H.J. Yang, H.X. Yang, L. Yang, Y.H. Yang, Y.X. Yang, Yifan Yang, M. Ye, M.H. Ye, J.H. Yin, Z.Y. You, B.X. Yu, C.X. Yu, J.S. Yu, C.Z. Yuan, Y. Yuan, A. Yuncu, A.A. Zafar, A. Zallo, Y. Zeng, Z. Zeng, B.X. Zhang, B.Y. Zhang, C.C. Zhang, D.H. Zhang, H.H. Zhang, H.Y. Zhang, J. Zhang, J.L. Zhang, J.Q. Zhang, J.W. Zhang, J.Y. Zhang, J.Z. Zhang, K. Zhang, L. Zhang, S.Q. Zhang, X.Y. Zhang, Y.H. Zhang, Y.T. Zhang, Yang Zhang, Yao Zhang, Yu Zhang, Z.H. Zhang, Z.P. Zhang, Z.Y. Zhang, G. Zhao, J.W. Zhao, J.Y. Zhao, J.Z. Zhao, Lei Zhao, Ling Zhao, M.G. Zhao, Q. Zhao, S.J. Zhao, T.C. Zhao, Y.B. Zhao, Z.G. Zhao, A. Zhemchugov, B. Zheng, J.P. Zheng, W.J. Zheng, Y.H. Zheng, B. Zhong, L. Zhou, X. Zhou, X.K. Zhou, X.R. Zhou, X.Y. Zhou, Y.X. Zhou, J. Zhu, K. Zhu, K.J. Zhu, S. Zhu, S.H. Zhu, X.L. Zhu, Y.C. Zhu, Y.S. Zhu, Z.A. Zhu, J. Zhuang, B.S. Zou, and J.H. Zou
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Physics ,QC1-999 - Abstract
Using 16 energy points of e+e− annihilation data collected in the vicinity of the J/ψ resonance with the BESIII detector and with a total integrated luminosity of around 100pb−1, we study the relative phase between the strong and electromagnetic amplitudes of J/ψ decays. The relative phase between J/ψ electromagnetic decay and the continuum process (e+e− annihilation without the J/ψ resonance) is confirmed to be zero by studying the cross section lineshape of μ+μ− production. The relative phase between J/ψ strong and electromagnetic decays is then measured to be (84.9±3.6)∘ or (−84.7±3.1)∘ for the 2(π+π−)π0 final state by investigating the interference pattern between the J/ψ decay and the continuum process. This is the first measurement of the relative phase between J/ψ strong and electromagnetic decays into a multihadron final state using the lineshape of the production cross section. We also study the production lineshape of the multihadron final state ηπ+π− with η→π+π−π0, which provides additional information about the phase between the J/ψ electromagnetic decay amplitude and the continuum process. Additionally, the branching fraction of J/ψ→2(π+π−)π0 is measured to be (4.73±0.44)% or (4.85±0.45)%, and the branching fraction of J/ψ→ηπ+π− is measured to be (3.78±0.68)×10−4. Both of them are consistent with the world average values. The quoted uncertainties include both statistical and systematic uncertainties, which are mainly caused by the low statistics. Keywords: Phase, Strong amplitude, Electromagnetic amplitude, J/ψ decay, BESIII
- Published
- 2019
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