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4. Nanometer scale characterizations of InGaN nanostructures grown on GaN template

Author

El Gmili, Youssef, Sundaram, Suresh, Puybaret, Renaud, Li, Xin, Bonanno, Peter, Pradalier, Cedric, Voss, Paul L, Salvestrini, Jean-Paul, Ougazzaden, Abdallah, Georgia Tech Lorraine [Metz], Université de Franche-Comté (UFC), Université Bourgogne Franche-Comté [COMUE] (UBFC)-Université Bourgogne Franche-Comté [COMUE] (UBFC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Georgia Institute of Technology [Atlanta]-CentraleSupélec-Ecole Nationale Supérieure des Arts et Metiers Metz-Centre National de la Recherche Scientifique (CNRS), Laboratoire d'Informatique de Grenoble (LIG), Université Pierre Mendès France - Grenoble 2 (UPMF)-Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS), Autonomous Systems Laboratory (BIOMEDIA), Commonwealth Scientific and Industrial Research Organisation [Canberra] (CSIRO), CSIRO Information and Commuciation Technologies (CSIRO ICT Centre), Laboratoire Matériaux Optiques, Photonique et Systèmes (LMOPS), and CentraleSupélec-Université de Lorraine (UL)

Subjects
[PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], ComputingMilieux_MISCELLANEOUS
Abstract

International audience

Published
2015

5. High-resolution dislocation imaging and micro-structural analysis of HVPE-βGa2O3 films using monochromatic synchrotron topography.

Author

Mahadik, Nadeemullah A., Tadjer, Marko J., Bonanno, Peter L., Hobart, Karl D., Stahlbush, Robert E., Anderson, Travis J., and Kuramata, Akito

Subjects
GALLIUM, MICROSTRUCTURE, HALIDES, VAPOR phase epitaxial growth, CRYSTALS
Abstract

Threading and basal dislocations were observed and their Burgers vectors ( b → ) were analyzed in 20 µm thick halide vapor phase homoepitaxially grown beta-gallium oxide (β−Ga2O3) films using 15 keV monochromatic synchrotron X-ray topography with symmetric reflection (004) and two asymmetric reflections (205) and (115) in back-reflection and grazing incidence angle geometries, respectively. In a 1 × 1.5 cm2 sample, threading screw dislocations with b → = 001 were observed with a density of 30 cm−2, whereas a single threading edge dislocation with b → = 100 was observed. Basal dislocations with b → = 1 2 112 were observed with a density of ∼20 cm−2, and a single basal dislocation with b → = 010 was observed. Rocking curve mapping of the three reflections was also performed on the entire sample with the same setup and a high resolution x-ray camera to obtain the full width at half maximum (FWHM), strain, and curvature maps in two almost orthogonal directions. The epilayer demonstrated excellent crystalline quality with a median FWHM of 8.2 arc sec in the (004) reflection and a very low median strain of ∼|8 × 10−5| obtained from both sample directions. The median radius of curvature was ∼−100 m along the [100] direction and ∼280 m along the [010] sample axis, indicating very low lattice plane curvature that enables high manufacturability and reliability of devices. [ABSTRACT FROM AUTHOR]

Published
2019
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6. A personal twist

Author

Bonanno, Peter

Subjects
Gencom Group -- Product information, Gencom Group -- Contracts, Labatt Brewing Company Ltd. -- Advertising, Labatt Brewing Company Ltd. -- Marketing, Labatt Brewing Company Ltd. -- Contracts, Breweries -- Advertising, Breweries -- Marketing, Breweries -- Contracts, Brewing industry, Advertising agencies -- Product information, Advertising agencies -- Contracts, Sales promotions, Contract agreement, Company marketing practices, Advertising, marketing and public relations, Business, Business, international
Abstract

The author examines a advertising promotion developed by The Gencom Group for Labatt. Topics include use of personalized beer labels, advertising campaigns, and marketing promotions.

Published
2002

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