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16 results on '"Avinash Burla"'

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1. Implementation and analysis of an automated multiscale measurement strategy for wafer scale inspection of micro electromechanical systems

2. Verlässlichkeitsanalyse von Indikator-Funktionen in einem Automatisierten Multiskalen-Messsystem

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3. Extrinsic calibration of a fringe projection sensor based on a zoom stereo microscope in an automatic multiscale measurement system

4. Assistant systems for efficient multiscale measurement and inspection

5. Rapid ideal template creation for the inspection of MEMS based on self-similarity characteristics

6. Learning by playing: how to create the perfect learning game for and with optics

7. An assistance system for the selection of sensors in multi-scale measurement systems

8. Automated multiscale measurement system for MEMS characterisation

9. Sensor and actuator conditioning for multiscale measurement systems on example of confocal microscopy

12. Fast hologram computation for holographic tweezers

13. Fast hologram computation and aberration control for holographic tweezers

14. Genetic programming applied to automatic algorithm design in multi-scale inspection systems

15. Fourier descriptors for defect indication in a multiscale and multisensor measurement system

16. Fourier descriptors for defect indication in a multiscale and multisensor measurement system.