30 results on '"Anstis, G. R."'
Search Results
2. The influence of atomic vibrations on the imaging properties of atomic focusers
3. Fatigue analysis of brittle materials using indentation flaws: Part 2 Case study on a glass-ceramic
4. Fatigue analysis of brittle materials using indentation flaws: Part 1 General theory
5. A Quantitative Analysis of Image Contrast from Extrinsic Stacking Faults
6. Plasmon resonances and electron phase shifts near Au nanospheres
7. Simulation for Scanning Electron Microscopy
8. Imaging point defects using a transmission electron microscope with controllable spherical aberration
9. Calculation of Absorptive Potentials Using Debye's Model of Lattice Dynamics
10. A `three-beam' analysis of resonance scattering in reflection high-energy electron diffraction
11. Electron channelling contrast imaging of interfacial defects in strained silicon-germanium layers on silicon
12. Theoretical Study of Weak-Beam Images of Stacking Faults Decorated with Impurities
13. A Critical Evaluation of Indentation Techniques for Measuring Fracture Toughness: II, Strength Method.
14. Kinetic theory of a one-dimensional model.
15. The kinematic theory of scattering by stacking faults with supplementary atomic displacements
16. An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging
17. Dark-field electron microscopy of dissociated dislocations and surface steps in silicon using forbidden reflections
18. Atomic structure of the NiSi2/(111)Si interface
19. Formation of antiphase-domain boundary tubes in B2 ordered alloys by cross-slip and annihilation of screw dislocations
20. Study of Diffuse Scattering by Means of High Resolution Structure Images
21. n-Beam lattice images. III. Upper limits of ionicity in W4Nb26O77
22. The calculation and interpretation of high-resolution electron microscope images of lattice defects
23. Resolution-Limiting Effects in Electron Microscope Images
24. The calculation of electron diffraction intensities by the multislice method
25. A quantitative analysis of image contrast from extrinsic stacking faults
26. Calculation of Absorptive Potentials Using Debye's Model of Lattice Dynamics.
27. Many-beam electron diffraction related to electron microscope diffraction contrast
28. Analysis of power spectra of high resolution electron micrographs
29. Calculation of RHEED intensities by a THEED algorithm
30. Limitations on the s-state approach to the interpretation of sub-angstrom resolution electron microscope images and microanalysis.
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.