Search

The possibility of fabricating two-dimensional Si layers on a CaF2/Si(111) film by molecular beam epitaxy is studied. The growth conditions, under which the regions of two-dimensional Si layers are formed, are found. Raman spectroscopy, transmission electron microscopy, photoluminescence, and electron paramagnetic resonance (EPR) studies have shown that regions of two-dimensional Si layers are formed in epitaxial structures prepared by the deposition of one to three biatomic Si layers on the CaF2/Si(111) film surface at a temperature of 550°С. The Raman spectra of these structures exhibit a narrow peak at 418 cm–1, which is due to light scattering on vibrations of Si atoms in the plane of a two-dimensional Si layer intercalated with calcium. The EPR spectra of multilayer structures with regions of two-dimensional Si layers embedded in CaF2 demonstrate an isotropic signal with an asymmetric Dyson shape and the g-factor $$g = 1.9992$$ under illumination. Consequently, this signal can be attributed to photoinduced conduction electrons in extended two-dimensional Si islands. These results may be useful for understanding the mechanisms of the formation of two-dimensional materials on CaF2/Si(111) substrates.

Представлены результаты исследования спектров излучения кристаллов и тонких пленок CuInSe2 при непрерывном (2 Вт/см2) и наносекундном импульсном лазерном возбуждении в диапазоне плотности мощности возбуждения ~1–100 кВт/см2 и температурах 10–160 К. Обнаружено, что в кристаллах CuInSe2 стимулированное излучение возникает в спектральной области 1,033 эВ с минимальным уровнем пороговой накачки 9,8 кВт/см2, а при уровнях накачки 36–76 кВт/см2 наблюдается лазерное излучение. Установлено, что для тонких пленок CuInSe2, сформированных на стеклянных подложках с предварительно осажденным на стекло слоем молибдена (структура CuInSe2/Mo/стекло), характерно появление только стимулированного излучения в области энергий 1,014–1,097 эВ с минимальным уровнем пороговой накачки 30 кВт/см2 при температуре 10 К. Обсуждаются механизмы возникновения стимулированного и лазерного излучения в соединении CuInSe2.

Исследована фото- и катодолюминесценция видимого диапазона в легированных эрбием ксерогелях титаната бария, полученных в виде порошка и мишени, спрессованной из него методом взрывного прессования. Порошок и мишень демонстрируют ап-конверсионную люминесценцию ионов эр- бия при возбуждении на длинах волн в областях 950—1000 и 1450—1550 нм, которая характеризуется интенсивными полосами 650 и 520—560 нм, а также слабой полосой -820 нм, что соответствует переходам 4F9/2-4I15/2, 2Н11/2-4I15/2, 4S3/2-4I15/2, 4I9/2-4I15/2 трехвалентного иона эрбия. Мишень демонстрирует также катодолюминесценцию при комнатной температуре и температуре жидкого азота с наиболее интенсивными полосами 650, 520 и 538 нм.

Semiconductor Cu2ZnSn(S x Se1-x )4 (CZTSSe) solid solution is considered as a perspective absorber material for solar cells. However, during its synthesis or deposition, any modification in the resulting optical properties is hardly predicted. In this study, experimental and theoretical analyses of CZTSSe bulk crystals and thin films are presented based on Raman scattering and absorption spectroscopies together with compositional and morphological characterizations. CZTSSe bulk and thin films are studied upon a change in the x = S/(S + Se) aspect ratio. The morphological study is focused on surface visualization of the solid solutions, depending on x variation. It has been discovered for the first time that the surface of the bulk CZTSSe crystal with x = 0.35 has pyramid-like structures. The information obtained from the elemental analysis helps to consider the formation of a set of possible intrinsic lattice defects, including vacancies, self-interstitials, antisites, and defect complexes. Due to these results and the experimentally obtained values of the band gap within 1.0-1.37 eV, a deviation from the calculated band gap values is estimated in the range of 1.0-1.5 eV. It is suggested which defects can have an influence on such a band gap change. Also, on comparing the experimental Raman spectra of CZTSSe with the theoretical modeling results, an excellent agreement is obtained for the main Raman bands. The proposed theoretical approach allows to estimate the values of concentration of atoms (S or Se) for CZTSSe solid solution directly from the experimental Raman spectra. Thus, the visualization of morphology and the proposed theoretical approach at various x values will help for a deeper understanding of the CZTSSe structure to develop next-generation solar cells.

Erbium upconversion (UC) photoluminescence (PL) from sol-gel derived barium titanate (BaTiO

The phase composition and structural and optical characteristics of thin films of Cu(In1–xGax)(SySe1–y)2 solid solutions with the chalcopyrite structure were investigated. The unit-cell constants according to x-ray diffraction analysis were a ~ 5.720 A and c ~ 11.52 A. The elemental compositions were x = Ga/(Ga + In) ~ 0.14 and y = S/(S + Se) ~ 0.11 for Cu(In1–xGax)(S ySe1–y)2 thin films. The optical band gap of Cu(In1–xGax)(S ySe1–y)2 solid solutions determined from measurements of photoluminescence spectra and luminescence excitation spectra at ~4.2 K was Eg ~ 1.122 eV. The mechanism of radiative recombination of nonequilibrium charge carriers in thin films of Cu(In1–xGax) (S ySe1–y)2 solid solutions is discussed.

Radiation-induced effects in Cu(In,Ga)Se2 alloy thin films after implantation with hydrogen ions with energies of 2.5, 5, and 10 keV and a dose of ~3 × 1015 cm–2 are studied. Comparative analysis of the optical characteristics of nonimplanted and hydrogen-implanted Cu(In,Ga)Se2 films is conducted on the basis of photoluminescence spectra and luminescence-excitation spectra recorded at liquid-helium temperature (~4.2 K). The band gap determined for Cu(In,Ga)Se2 alloys by mathematical processing of the luminescence-excitation spectra is ~1.171 eV. In the photoluminescence spectra of nonimplanted and hydrogen-implanted Cu(In,Ga)Se2 films, an intense band is detected, with a maximum at ~1.089 eV. The band is defined by the recombination of free electrons with holes localized in the valence-band tails. It is established that broad bands with maximums at the energies 0.92 and ~0.77 eV are defined by the radiative recombination of nonequilibrium charge carriers at deep energy levels of ion-induced acceptor defects formed in the band gap of Cu(In,Ga)Se2 alloys. The conditions for the effect of the ion passivation of dangling electron bonds at the surface and in the bulk of polycrystalline Cu(In,Ga)Se2 films and the nature of structural point defects and the mechanisms of radiative recombination are discussed.

Semiconductor Cu2ZnSn(SxSe1–x)4 (CZTSSe) solid solution is considered as a perspective absorber material for solar cells. However, during its synthesis or deposition, any modification in the resulting optical properties is hardly predicted. In this study, experimental and theoretical analyses of CZTSSe bulk crystals and thin films are presented based on Raman scattering and absorption spectroscopies together with compositional and morphological characterizations. CZTSSe bulk and thin films are studied upon a change in the x = S/(S + Se) aspect ratio. The morphological study is focused on surface visualization of the solid solutions, depending on x variation. It has been discovered for the first time that the surface of the bulk CZTSSe crystal with x = 0.35 has pyramid-like structures. The information obtained from the elemental analysis helps to consider the formation of a set of possible intrinsic lattice defects, including vacancies, self-interstitials, antisites, and defect complexes. Due to these results and the experimentally obtained values of the band gap within 1.0–1.37 eV, a deviation from the calculated band gap values is estimated in the range of 1.0–1.5 eV. It is suggested which defects can have an influence on such a band gap change. Also, on comparing the experimental Raman spectra of CZTSSe with the theoretical modeling results, an excellent agreement is obtained for the main Raman bands. The proposed theoretical approach allows to estimate the values of concentration of atoms (S or Se) for CZTSSe solid solution directly from the experimental Raman spectra. Thus, the visualization of morphology and the proposed theoretical approach at various x values will help for a deeper understanding of the CZTSSe structure to develop next-generation solar cells.

The light-emitting properties of Si-rich silicon nitride films deposited on the Si (100) substrate by plasma-enhanced (PECVD) and low-pressure chemical vapor deposition (LPCVD) have been investigated. In spite of the similar stoichiometry (SiN1.1), nitride films fabricated by different techniques emit in different spectral ranges. Photoluminescence (PL) maxima lay in red (640 nm) and blue (470 nm) spectral range for the PECVD and LPCVD SiN1.1 films, respectively. It has been shown that equilibrium furnace annealing and laser annealing by ruby laser (694 nm, 70 ns) affect PL spectra of PECVD and LPCVD SiN1.1 in a different way. Furnace annealing at 600 °C results in a significant increase of the PL intensity of the PECVD film, while annealing of LPCVD films result only in PL quenching. It has been concluded that laser annealing is not appropriate for the PECVD film. The dominated red band in the PL spectrum of the PECVD film monotonically decreases with increasing an energy density of laser pulses from 0.45 to 1.4 J/cm2. Besides, the ablation of PECVD nitride films is observed after irradiation by laser pulses with an energy density of > 1 J/cm2. This effect is accompanied by an increase in blue emission attributed to the formation of a polysilicon layer under the nitride film. In contrast, the LPCVD film demonstrates the high stability to pulsed laser exposure. Besides, an increase in the PL intensity for LPCVD films is observed after irradiation by a double laser pulse (1.4 + 2 J/cm2) which has not been achieved by furnace annealing.

Cu2ZnSnSe4 (CZTSe) is amongst leading candidates for the absorber layer in sustainable solar cells. We examine CZTSe thin films with [Cu]/[Zn + Sn] of 0.99 and [Zn]/[Sn] of 1.07, deposited on Mo/glass substrates, and solar cells fabricated from these films. The bandgap (Eg) of the as deposited films and solar cells was examined by photoluminescence excitation (PLE) whereas the temperature and excitation intensity dependence of photoluminescence (PL) spectra was used to examine the nature of radiative recombination. The 6 K PL spectra of CZTSe/Mo exhibit an intense broad and asymmetrical band P1 at 0.822 eV and a lower intensity band P2 at 0.93 eV. The shape of this band, high rates of blue shift with excitation intensity rise ( j-shift) j(P1) = 14 meV and j(P2) = 8 meV per decade, and red shifts of both bands with increasing temperature suggest that both bands are associated with valence band tails due to potential fluctuations caused by high populations of charged defects. The mean depth of such fluctuation γ of 24 meV was estimated from the low energy side of P1. Device processing increased Eg, blue shifted P1, decreased its width, j-shift and the mean depth of potential fluctuations. These can be due to the annealing and/or can partly be related to KCN etching and the chemical effect of Cd, from CdS replacing copper at the CdS–CZTSe interface layer. Processing induced a new broad band P3 at 1.3 eV (quenching with Ea = 200 meV). We attributed P3 to defects in the CdS layer.

Multi-layer film structures BaTiO3/SiO2 with a thickness of ~1 μm containing up to 14 pairs of layers were synthesized by the sol–gel method with sequential heat treatment. It is shown that the synthesized structures are X-ray amorphous. The formation of bands in the transmission and reflection spectra caused by interference effects is demonstrated. A more regular structure exhibits a photon band gap (opacity band) in the visible range with main minimum at 636 nm and corresponding maximum in the reflection spectra. Dispersion characteristics of barium titanate films with different concentrations of initial sols were studied and an increase in the refractive index with an increase in the concentration of sol was demonstrated. For a sol with a concentration of 60 mg/mL, the refractive index in the spectral range of 390–1600 nm is 1.88–1.81. The prospects of sol–gel technology for the formation of BaTiO3/SiO2 structures for nanophotonics and solar radiation converters are discussed.

Plasmonic enhancement of the photoluminescence in hybrid structures with SiGe quantum dots and Ag nanoislands was found. Ag nanoislands grown on the top of the multilayer structures with SiGe quantum dots (QDs) support a surface plasmon resonance that can be tuned to the QD emission wavelength by changing of Ag nanoparticle parameters. Photoluminescence measurements of the hybrid metal-semiconductor nanostructures revealed a fourfold increase of the integral intensity of SiGe QD emission in the spectral range from 0.8 to 1 eV.

The two triple-layered SiO 2 /SiN x /SiO 2 structures with Si-rich and N-rich silicon nitride active layer were fabricated on p -type Si-substrates by chemical vapour deposition. The SiN x layer of different composition ( x = 0.9 and x = 1.4) was obtained by changing the ratio of the SiH 2 Cl 2 /NH 3 flow rates during deposition of a silicon nitride active layer (8/1 and 1/8, respectively). The spectroscopic ellipsometry and photoluminescence (PL) measurements showed that the refractive index, the absorbance and luminescence properties depend on a chemical composition of silicon nitride layers. The structures with Si-rich and N-rich SiN x active layers emit in the red (1.9 eV) and blue (2.6 eV) spectral ranges, respectively. The PL intensities of different structures are comparable. The rapid thermal annealing results in the intensity decrease and in the PL spectra narrowing in the case of SiN 1,4 active layer, whereas the increase in the emission intensity and the PL spectra broadening are observed in the case of the annealed sample with a SiN 0,9 active layer. The PL origin and the effect of annealing treatment have been discussed, taking into account the band tail mechanism of radiative recombination. Multilayered (SiO 2 /SiN x ) n /Si structures are of practical interest for creation of effective light sources on the basis of current Si technology.

Structural and optical properties of SiO2 (600 nm)/Si films successively implanted with two types of ions (Zn and Se) or three types of ions (Zn, Se and S) and afterwards annealed at 900 °C were investigated. RS, PL and TEM methods were used to characterize A2B6 nanocrystals synthesized in SiO2 matrix. The Raman spectra recorded using an excitation with two different laser lines (355 and 473 nm) have shown the formation of ZnSe nanocrystals after a double implantation of Zn and Se ions, while ZnSxSe1−x nanoclusters have been synthesized after a triple implantation of Zn, Se and S ions. Based on Raman spectra recorded with blue and UV excitations, the possible sulfur content (x ≈ 0.4) has been estimated for synthesized ternary alloy. The intensive PL bands for SiO2 films implanted with (Zn, Se, S) and (Zn, Se) were detected in the blue and red spectral ranges, respectively.

Excitonic quality CuInSe2 crystals were studied using low-temperature (10 K) photoluminescence (PL) excited by continuous wave and nanosecond pulsed lasers at power densities from 0.01 to 76 kW/cm2. Increasing the excitation power density level to 26 kW/cm2 resulted in the appearance of a stimulated emission SE-band in the PL spectra at 1.035 eV. Further increase in the excitation level to 39 kW/cm2 generated on the top of the SE band, a structure of equidistant sharp lines attributed to laser emission. © 2021 Author(s). This work was supported by State Program of Scientific Research of the Republic of Belarus “Physical Material Science, New Materials and Technologies” (Project No. 1.4.4) and Belarusian Republican Foundation of Basic Research (Grant No. F20M-058). The research was carried out within the state assignment of Ministry of Science and Higher Education of the Russian Federation (“Spin” No. AAAA-A18-118020290104-2).

The halide perovskite material has attracted vast attention as a versatile semiconductor in the past decade. With the unique advantages in physical and chemical properties, they have also shown great potential in photocatalytic applications. This review aims at the specific design principles triggered by the unique properties when employing halide-perovskite-based photocatalytic systems from the following perspectives: (I) Design of photoelectrocatalytic device structures including the n-i-p/p-i-n structure, photoelectrode device encapsulation, and electrolyte engineering. (II) The design of heterogeneous photocatalytic systems toward the hydrogen evolution reaction (HER) and CO2 reduction reaction, including the light management, surface/interface engineering, stability improvement, product selectivity engineering, and reaction system engineering. (III) The photocatalysts for the environmental application and organic synthesis. Based on the analyses, the review also suggests the prospective research for the future development of halide-perovskite-based photocatalytic systems.

Solar cells with the structure ZnO/CdS/Cu2ZnSnSe4/Mo/glass were studied by photoluminescence (PL) before and after irradiation with a dose of 1.8 × 1015 cm−2 and then 5.4 × 1015 cm−2 of 10 MeV electrons carried out at 77 K in liquid nitrogen bath. The low temperature PL spectra before irradiation revealed two bands, a broad and asymmetrical dominant band at 0.94 eV from the CZTSe layer and a lower intensity high energy band (HEB) at 1.3 eV, generated by defects in the CdS buffer layer. Analysis of the excitation intensity and temperature dependencies suggested that the dominant band is free-to-bound (FB): the recombination of free electrons with holes localised at acceptors whose energy levels are affected by potential fluctuations of the valence band due to high concentrations of randomly distributed charged defects. Irradiation did not induce any new band in the examined spectral range (from 0.5 μm to 1.65 μm) but reduced the intensity of both bands in the PL spectra measured at 77 K without warming the cells. The higher the dose the greater was the reduction. After this the cells were warmed to 300 K and moved to a variable temperature cryostat to measure temperature dependencies of the PL spectra. After irradiation the red shift rate of the FB band with temperature rise was found to increase. Electrons displace atoms in the lattice creating primary defects: interstitials and vacancies. These defects recombine during and shortly after irradiation forming secondary defect complexes which work as deep non-radiative traps of charge carriers reducing the PL intensity and increasing the rate of the temperature red shift. Irradiation did not affect the mean depth of the band tails estimated from the shape of the low energy side of the dominant PL band. © 2020 Elsevier Ltd European Commission, EC European Regional Development Fund, FEDER: TK141 Ministry of Science and Higher Education of the Russian Federation: АААА-А18-118020290104-2 The research was supported by the Ministry of Science and Higher Education of the Russian Federation (topic “Spin” № АААА-А18-118020290104-2 ) and the European Union through the European Regional Development Fund, Project TK141 .

This work devotes to a comparative study of the photoluminescence of Ge/Si epitaxial structures with quantum dots created with using ion beam irradiation and structures with Ge nanoclusters formed as a result of the implantation of Ge ions into silicon and subsequent annealing.

A multiple enhancement of the photoluminescence (PL) of Ge/Si quantum dots (QDs) in structures with silver nanoparticles was obtained. The amplification effect is explained by an increase in the rate of radiative recombination of charge carriers localized at QDs.

High structural quality single crystals of CuGaSe2 were studied using photoluminescence (PL), optical reflectivity (OR) and circularly polarised magneto-reflectance (MR) at 4.2 K in magnetic fields B up to 14 T. At B = 0 T both the PL and OR spectra exhibited the A free exciton, associated with the uppermost sub-band of the valence band of CuGaSe2 split by the tetragonal distortion in the lattice. The magnetic field induced a blue shift of the exciton in the MR spectra. Analysis of the dependence of the spectral position of the A exciton on B in the MR spectra, measured for both right and left circular polarisations of light, enabled the magnitude of its effective g-factor to be determined |g| = 0.46. © 2020 IOP Publishing Ltd.

Thin films of Cu(In,Ga)Se2 on Mo coated glass substrates were studied by photoluminescence (PL) technique before and after irradiation in liquid nitrogen bath with a dose of 1.8 x 1015 cm−2 of 10 MeV electrons to determine the nature of radiation defects in Cu(In,Ga)Se2. The PL spectra before irradiation contain a broad dominant band at 1 eV, consisting of 3 peaks P1, P2 and P3, and two low intensity bands P4 at 0.86 eV and P5 at 0.77 eV. Because of their strong j-shift the P1, P2 and P3 were assigned to the free-to-bound (FB) recombination of free electrons and holes localised at 3 different acceptors whose energy levels are affected by potential fluctuations of the valence band. The P4 and P5 bands were also assigned to the FB recombinations of free electrons but with deeper acceptors. Irradiation reduced the PL intensity of the dominant 3 bands P1, P2 and P3. We assign such a reduction to the formation of nonradiative defects acting as deep traps. Irradiation did not change the j-shift of the P3 band (12 meV/d) suggesting that the acceptor, associated with P3, was not affected by irradiation. However, irradiation reduced the P2 j-shift from 13.8 meV/d to 4 meV/d demonstrating a significant reduction of the compensation level associated with this acceptor. Warming to the room temperature doubled the intensity of the dominant band probably due to annealing of some radiation induced defects. It increased the P2 j-shift to 10 meV/d demonstrating rising compensation level associated with this acceptor.

In the present work, silicon nitride, and oxide films, as well as two-layered SiNx/SiO2 and three-layered SiO2/SiNx/SiO2 structures, were fabricated on p-type Si-substrates. The structure and element composition was studied by scanning electron microscopy and Rutherford backscattering spectroscopy, respectively. It was shown, spectral positions of photoluminescence maxima, as well as edge absorption, were determined by stoichiometry of SiNx layers. No electroluminescence signal was registered from single-layered silicon nitride films. The intense band at 1.9 eV dominated the electroluminescence spectra of single-layered silica film as well as two- and three-layered structures. It was attributed to silane groups in SiO2 layers. The contribution of emission from silicon nitride layers into electroluminescence of the two- and three-layered structures is discussed.

Thin films of Cu2ZnSnSe4 (CZTSe) were fabricated by the selenisation of metallic precursors sequentially deposited on Mo coated glass substrates. The surface morphology and cross section, studied by a scanning electron microscope (SEM), reveal densely packed grains with sizes in excess of 1 µm and CZTSe film with a thickness of 1.4 µm. The elemental composition of both the precursors and CZTSe films was measured by an energy dispersive X-ray analyser demonstrated a copper deficiency and zinc excess as well as a near stoichiometric content of Se. A set of 4 as deposited CZTSe films was used to produce solar cells with the structure ZnO/CdS/Cu2ZnSnSe4/Mo/glass. These films were coated with CdS buffer layer using a standard chemical bath deposition after chemical etching using KCN or/and ammonia: film E was not etched, film B was etched in KCN for 2 minutes, film C was etched in KCN for 5 minutes and film D was etched in KCN for 30s and then in ammonia for 5 minutes. Solar cells were then completed by DC-magnetron deposition of ZnO/ZnO:Al transparent front contacts. Finally solar cells with areas of 3x3 mm2 were separated by mechanical scribing. The structural properties of the cells and phase content of the CZTSe layer were examined by x-ray diffraction (XRD). Low intensity reflexes of the secondary phases SnSe and SnSe2 were also present. The bandgaps Eg of the CZTSe layers in the cells, measured by photoluminescence excitation (PLE) at 4.2 K, were found to be of 1.05 eV in all the four cells. This cell also showed the highest FF of 41.1% whereas the best Isc of 46.6 mA/cm2, demonstrated by the D cell. The highest conversion efficiency of 6.2% was obtained for the E cell, produced without any etch, and for the D one after 30 s etch in KCN plus 5 minutes in ammonia.

Oxide-nitride-oxide-silicon (SiO2/SiN0.9/SiO2/Si) structures have been fabricated by chemical vapor deposition. The elemental composition and light emission properties of “SiO2/SiN0.9/SiO2/Si” structures have been studied using Rutherford backscattering spectroscopy (RBS), photo- and electroluminescence (Pl, El). The RBS measurements has shown the presence of an intermediate silicon oxynitride layers at the SiO2–SiN0.9 interfaces.It has been shown that the photoluminescence of the SiO2/SiN0.9/SiO2/Si structure is due to the emission of a SiN0.9 layer, and the electroluminescence is attributed to the emission of silicon oxide and oxynitride layers. A broad intense band with a maximum at 1.9 eV dominates the Pl spectrum. This band attributed to the radiative recombination of excited carriers between the band tail states of the SiN0.9 layer. The origin of the less intense Pl band at 2.8 eV is associated with the presence of nitrogen defects in the silicon nitride.El was excited in the electrolyte-dielectric-semiconductor system. The electric field strength in the SiO2 layers reached 7–8 MV/cm and exceeded this parameter in nitride layer nearly four times. The electrons accelerating in electric field of 7–8 MV/cm could heat up to energies more than 5 eV. It is sufficient for the excitation of luminescence centres in the silicon oxide and oxynitride layers. The SiO2/SiN0.9/SiO2/Si composition El bands with quantum energies of 1.9 and 2.3 eV are related to the presence of silanol groups (Si–OH) and three-coordinated silicon atoms (≡Si•) in the silicon oxide layers. The El band with an energy of 2.7 eV is attributed to the radiative relaxation of silylene (O2=Si:) centers in the silicon oxynitride regions. It is observed the least reduction of this band intensity under the influence of strong electric fields after a charge flow of 1–3 C/cm2.

The stimulated emission of Cu(In,Ga)Se2 alloy thin films formed by magnetron-assisted sputtering onto a sodium-fluoride layer deposited onto a molybdenum layer on a glass substrate is observed. The structural and optical parameters of the films are determined by scanning electron microscopy, local X-ray spectral microanalysis, X-ray structural analysis, and low-temperature luminescence (T = 10 K) measurements in the range of excitation levels of 1.6–75 kW cm–2 provided by nanosecond nitrogen-laser pulses. The stimulated emission threshold corresponds to ~25 kW cm–2. Comparative analysis of the emission of Cu(In,Ga)Se2 thin films suggests that the introduction of sodium results in significant improvement of the structural quality, specifically, in a decrease in the density of energy states in the band tails and in a decrease in the concentration of nonradiative-recombination centers.

New approaches to enhance properties of silicon based quantum dot heterostructures for optical device application were developed. That is strain driven heteroepitaxy, small-sized quantum dots, elemental compositions of the heterointerface, virtual substrate, plasmonic effects, and the quantum dot charging occupation with holes in epitaxially grown Ge quantum dots (QDs) on Si (100). Experiments have shown extraordinary optical properties of Ge/Si QDs heterostructures and mid-infrared quantum dot photodetectors performance.

Magnetotransmission (MT) at magnetic fields up to 29 T was used to study the electronic structure of $\mathrm{CuInS}{\mathrm{e}}_{2}$ in thin polycrystalline films. The zero field absorption spectra exhibited resolved A, B, and C free excitons. Quantum oscillations, due to diamagnetic excitons comprising electrons and holes from Landau levels quantized in the conduction and valence band, respectively, appeared in the MT spectra at fields over 5 T. Spectral energies of Landau levels and binding energies of the corresponding diamagnetic excitons, theoretically calculated assuming a quasicubic approximation of the $\mathrm{CuInS}{\mathrm{e}}_{2}$ tetragonal lattice structure, helped to identify the character of the experimentally observed diamagnetic excitons. Spectral energies of diamagnetic excitons in the MT spectra with different circular polarizations were used to determine the electron and light hole effective masses, whereas heavy hole masses as well as the \ensuremath{\gamma} and ${\ensuremath{\gamma}}_{1}$ Luttinger parameters, ${E}_{p}$ Kane energy, and F parameter of the influence of remote bands, as well as their polaron values, were calculated using the Luttinger theory.

The photoluminescence (PL) of Ge/Si nanostructures synthesized by using Ge + ion bombardment is studied. The structure represents a Si substrate with GeSi nanoclusters created by 80 keV Ge implantation with a fluence of ∼1015 ions/cm 2 and subsequent thermal annealing. The PL measurements confirm the advantage of Ge/Si structures synthesized using Ge + ion bombardment over the usual epitaxial structures with GeSi quantum dots. The presence of defects produced by Ge implantation results in pronounced PL at telecom wavelengths up to room temperature. The results provide a basis for creating efficient light emitters compatible with the existing Si technology.

A comparative analysis of free and bound excitons in the photoluminescence (PL) spectra of CuInS2 single crystals grown by the traveling heater (THM) and the chemical vapor transport (CVT) methods is presented. The values of the binding energy of the A free exciton (18.5 and 19.7 meV), determined by measurements of the spectral positions of the ground and excited states, allowed the Bohr radii (3.8 and 3.7 nm), bandgaps (1.5536 and 1.5548 eV) and dielectric constants (10.2 and 9.9) to be calculated for CuInS2 crystals grown by THM and CVT, respectively. © 2017 Elsevier B.V.

Si-rich (SiN 1.1 ) and N-rich (SiN 1.5 ) silicon nitride films were grown on the Si wafers by plasma-enhanced chemical vapor deposition. Their composition and structure were investigated by Rutherford backscattering spectroscopy and transmission electron microscopy. The effect of composition and post-deposition annealing temperature on the SiN x light-emitting properties was investigated by the examination of photoluminescence. The intensive bands for the Si-rich and N-rich nitride films were detected in the red and blue spectral ranges, respectively. Photoluminescence bands transformations for the annealed nitride films can be ascribed to the increasing K- and N-centre concentration via the Si H and N H bonds rupture and the competitive processes of defect annihilation. On the basis of photoluminescence band FWHM broadening with “ x ” increasing, the FWHM dependence on the measurement temperature and SiN x films inhomogeneous structure, the emission from the SiN 1.1 and SiN 1.5 films is attributed to the transitions between the bands of defect and tail states associated with chemical disordering.

Transmission electron microscopy (TEM), Raman scattering (RS), and photoluminescence (PL) techniques are used to study the structure, phase composition, and radiative properties of silicon with implanted InSb nanocrystals produced by implanting Sb+ and In+ ions with energies of 350 keV and fluences of 3.5·1016 cm–2 followed by heat treatment at 1100°C for 3, 10, and 60 min. The TEM and RS data confirm the formation of InSb nanocrystals with sizes ranging from 2 to 50 nm in the implanted and annealed samples. A broad band in the 0.8–1.05 eV range is detected in low-temperature (4.2 K) PL spectra of the annealed samples. The possible mechanisms for the luminescence in this range are luminescence of InSb nanocrystals and radiative recombination between the conduction band of silicon and an In acceptor.

Glasses of the K2O ZnO Al2O3 SiO2 system co-doped with Eu2O3 and Yb2O3 were prepared by the melt-quenching technique. Transparent zincite (ZnO) glass–ceramics were obtained by secondary heat-treatments at 680–860 °C. At 860 °C, traces of Eu oxyapatite appeared in addition to ZnO nanocrystals. The average crystal size obtained from the X-ray diffraction data was found to range between 14 and 35 nm. Absorption spectra of the initial glasses are composed of an absorption edge and absorption bands due to electronic transitions of Eu3+ ions. With heat-treatment, the absorption edge pronouncedly shifts to the visible spectral range. The luminescence properties of the glass and glass-ceramics were studied by measuring their excitation and emission spectra at 300, 78, and 4.2 K. Strong red emission of Eu3+ ions dominated by the 5D0–7F2 (612 nm) electric dipole transition was detected. Changes in the luminescence properties of the Eu3+-related excitation and emission bands were observed after heat-treatments at 680 °C and 860 °C. The ZnO nanocrystals showed both broad luminescence (400–850 nm) and free-exciton emission near 3.3 eV at room temperature. The upconversion luminescence spectrum of the initial glass was obtained under excitation of the 976 nm laser source.

The luminescence properties of double Ge/Si quantum dot structures are studied at liquid helium temperature depending on the Si spacer thickness d in QD molecules. A seven-fold increase in the integrated photoluminescence intensity is obtained for the structures with optimal thickness d = 2 nm. This enhancement is explained by increasing the overlap integral of electron and hole wavefunctions. Two main factors promote this increasing. The first one is that the electrons are localized at the QD base edges and their wavefunctions are the linear combinations of the states of in-plane Δ valleys, which are perpendicular in k-space to the growth direction [001]. This results in the increasing probability of electron penetration into Ge barriers. The second factor is the arrangement of Ge nanoclusters in closely spaced QD groups. The strong tunnel coupling of QDs within these groups increases the probability of hole finding at the QD base edge, that also promotes the increase in the radiative recombination probability.

The photoluminescence (PL) of the combined Ge/Si structures representing a combination of large (200–250 nm) GeSi disk-like quantum dots (nanodisks) and four-layered stacks of compact groups of smaller (30 nm) quantum dots grown in the strain field of nanodisks was studied. The multiple increase in the PL intensity was achieved by the variation of parameters of vertically aligned quantum dot groups. The experimental results were analyzed on the basis of calculations of energy spectra, electron and hole wave functions. It was found that the quantum dot arrangement in compact groups provides the effective electron localization in Δx,y-valleys with an almost equal probability of finding an electron in the Si spacer and Ge barrier. As a result, the main channels of radiative recombination in the structures under study correspond to spatially direct optical transitions.

The effect of solar cell processing (including etching in KCN along with deposition of CdS and ZnO) on photoluminescence (PL) spectra and bandgap E g (measured at 4.2 K by photoluminescence excitation) of Cu 2 ZnSnSe 4 films, produced by selenising metallic precursors at 450 °C, 500 °C and 550 °C, was studied. Temperature and excitation intensity analysis of the P1 dominant band in the PL spectra of solar cells suggests that after processing this band still can be assigned to the free-to-bound recombination of free electrons with holes bound at deep acceptor levels influenced by valence band-tails. However processing increased the intensity of P1 and blue shifted it. The strongest effect was observed for the film selenised at 500 °C. For the film selenised at 450 °C the blue shift and increase in the intensity were smaller and only a slight intensity rise was found for the film selenised at 550 °C. The intensity increase we assign to a reduction in the concentration of non-radiative recombination centers on the surface because of the etching and changes in doping due to inter-diffusion of Cd, S, Se and Zn after the deposition of CdS. Such an inter-diffusion depends on the elemental composition of the films defining the chemistry of defects and influencing E g which increased in the film selenised at 500 °C but decreased in the other films. Processing increased the P1 shift rate (j-shift) with excitation power change in all the films demonstrating a higher compensation degree in the solar cells which is consistent with the formation of an interface layer containing new donors Cd Cu . © 2019 Elsevier B.V.

CuGaSe2 single crystals are studied using magneto-reflectivity at 4.2 K in magnetic fields B up to 20 T. The A and B free excitons, observed in the optical reflectivity spectra, blue shift with increasing B. A low-field perturbation approach within the anisotropic hydrogenic model is used to fit the dependence of the spectral position of these excitons on B. The A and B exciton reduced masses of 0.115m0 and 0.108m0 (m0 is the free electron mass), Rydbergs of 12.9 and 12.2meV, Bohr radii 5.08 and 5.4 nm, and effective hole masses of 0.64m0 and 0.48m0, respectively, are determined.

Cu2ZnSnSe4 (CZTSe) is one of the leading candidates for the absorber layer in sustainable solar cells. Thin films of CZTSe with a near stoichiometric [Cu]/[Zn + Sn] were used to produce solar cells with conversion efficiency η = 6.4% by a standard solar cell processing including KCN etching and the deposition of CdS and ZnO. Both CZTSe films and solar cells were examined using photoluminescence (PL) to analyse the nature of radiative recombination and photoluminescence excitation (PLE) at 4.2 K to determine the bandgap (E g). Low temperature PL spectra of the films reveal an intense band P1 at 0.81 eV and a low intensity band P2 at 0.93 eV. Their temperature and excitation intensity dependencies suggest that they both involve recombinations of free electrons with holes localised at acceptors with the energy level influenced by potential fluctuations in the valence band. We associate P1 and P2 with different fractions of CZTSe: with a lower and higher degree of order of Cu and Zn on the cation sub-lattice, respectively. Device processing reduced the intensity of P1 by 2.5 whereas the intensity of P2 increased by a 1.5. We assign this to a low temperature annealing due to CdS and ZnO deposition which increased the fraction of CZTSe with high degree of Cu/Zn order and decreased the fraction with low degree of Cu/Zn order. Device processing increased E g, blue shifted P1, decreased its width, j-shift and the mean depth of potential fluctuations. These can also be related to the annealing and/or KCN etching and the chemical effect of Cd, due to CdS replacing copper at the CdS-CZTSe interface layer. Processing induced a new broad band P3 at 1.3 eV (quenching with E a = 200 meV) which we attributed to defects in the CdS layer. © 2018 IOP Publishing Ltd.

Samples of SiO2 (600 nm)/Si have been implanted with Sn ions (200 keV, 5×1016 cm−2 and 1×1017 cm−2) at room temperature and afterwards annealed at 800 and 900°C for 60 minutes in ambient air. The structural and light emission properties of “SiO2+Sn-based nanocluster” composites have been studied using Rutherford backscattering spectroscopy, transmission electron microscopy in cross section and plan-view geometry, electron microdiffraction, and photoluminescence (PL). A strict correspondence of Sn concentration profiles and depth particle distributions has been found. In the case of 1×1017 cm−2 fluence, the impurity accumulation in the subsurface zone during the thermal treatment leads to swelling and to the formation of dendrites composed of large and coalesced nanoparticles of grey contrast. The appearance of dendrites is most probably due to the SnO2 phase formation. The as-implanted samples are characterized by a weak emission with maximum at the blue range (2.9 eV). The PL intensity increases by an order of magnitude after annealing in an oxidizing atmosphere. The narrowest and most intense PL band has maximum at 3.1 eV. Its intensity increases with increasing fluence and annealing temperature. This emission can be attributed to the formation of the SnO2 phase (in the form of separate clusters or shells of Sn clusters) in the subsurface region of the SiO2 matrix.

Cu2ZnSnSe4 (CZTSe) is a semiconductor used as the absorber layer in highly promising sustainable thin film solar cells. The authors study the effect of Ar+ etching of copper deficient and zinc excess CZTSe thin films deposited on Mo/glass substrates on the surface elemental composition, measured by x-ray photoelectron spectroscopy, and photoluminescence (PL) spectra. Low temperature PL spectra reveal a broad asymmetrical band at 0.95 eV. The temperature and excitation intensity dependencies of this band suggest that it is a free-to-bound (FB) recombination of electrons from the conduction band with holes localized at an acceptor affected by potential fluctuations. The surface composition of the as grown films demonstrates a strong copper deficiency: [Cu]/[Zn + Sn] = 0.33. The etching of the film surface using Ar+ beam increases [Cu]/[Zn + Sn] to 0.51, which is significantly smaller than that of 0.78 in the bulk, measured by wavelength dispersive x-ray analysis, demonstrating the presence on the surface of a copper-depleted layer. The Ar+ etching drastically reduces the FB band intensity by a factor of 4.5, broadens it and develops a low energy tail. Ar ions displace atoms in CZTSe lattice creating primary radiation defects, vacancies, and interstitials, which recombine at room temperature forming antisite defects with deep energy levels. Some of them generate the observed low energy tail and increase the mean depth of potential fluctuation γ, determined from the shape of the low energy side of FB band, from 24 meV before Ar+ etching to 35 meV after. Other deep defects work as nonradiative recombination centers reducing the intensity of the FB band. © 2018 Author(s).